hcts393ms Intersil Corporation, hcts393ms Datasheet

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hcts393ms

Manufacturer Part Number
hcts393ms
Description
Rad-hard Dual 4-stage Binary Counter
Manufacturer
Intersil Corporation
Datasheet
August 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Latch-Up Free Under Any Conditions
• Fanout (Over Temperature Range)
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
• Input Current Levels Ii
Description
The Intersil HCTS393MS is a Radiation Hardened 4-stage
riple-carry binary counter. All counter stages are master-
slave flip-flop. The state of the stage advances one count on
the negative transition of each clock pulse. A high voltage
level on the MR line resets all counters to their zero state. All
inputs and outputs are buffered.
The HCTS393MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCTS393MS is supplied in a 14 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
HCTS393DMSR
HCTS393KMSR
HCTS393D/Sample
HCTS393K/Sample
HCTS393HMSR
Bit-Day (Typ)
- Standard Outputs: 10 LSTTL Loads
- VIL = 0.8V Max
- VIH = VCC/2 Min
PART NUMBER
10
RAD (Si)/s 20ns Pulse
5 A at VOL, VOH
TEMPERATURE RANGE
12
o
C to +125
-55
-55
RAD (Si)/s
o
o
C to +125
C to +125
+25
+25
+25
o
o
o
o
C
C
C
C
2
/mg
-9
o
o
C
C
Errors/
672
Pinouts
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
HCTS393MS
MR 1
CP 1
Q0 1
Q1 1
Q2 1
Q3 1
GND
SCREENING LEVEL
FLATPACK PACKAGE (FLATPACK)
14 LEAD CERAMIC DUAL-IN-LINE
14 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
Dual 4-Stage Binary Counter
MR 1
CP 1
GND
Q0 1
Q1 1
Q2 1
Q3 1
MIL-STD-1835 CDFP3-F14
MIL-STD-1835 CDIP2-T14
1
2
3
4
5
6
7
1
2
3
4
5
6
7
TOP VIEW
TOP VIEW
Radiation Hardened
14 Lead SBDIP
14 Lead Ceramic Flatpack
14 Lead SBDIP
14 Lead Ceramic Flatpack
Die
14
13
12
11
10
9
8
14
13
12
11
10
Spec Number
9
8
File Number
PACKAGE
VCC
2 CP
2 MR
2 Q0
2 Q1
2 Q2
2 Q3
VCC
2 CP
2 MR
2 Q0
2 Q1
2 Q2
2 Q3
518633
3071.1

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hcts393ms Summary of contents

Page 1

... The HCTS393MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. The HCTS393MS is supplied lead Ceramic flatpack (K suffi SBDIP Package (D suffix). Ordering Information PART NUMBER ...

Page 2

... HCTS393MS 3(11) 4(10 High Lvel L = Low Logic Level Immaterial = Low-to-High High-to-Low ...

Page 3

... VCC = 4.5V, VIH = 2.25V, Functional Test VIL = 0.8V (Note 2) NOTES: 1. All voltages referenced to device GND. 2. For functional tests, VO 4.0V is recognized as a logic “1”, and VO Specifications HCTS393MS Reliability Information Thermal Resistance SBDIP Package 10mA Ceramic Flatpack Package . . . . . . . . . . . 25mA Maximum Package Power Dissipation at +125 SBDIP Package ...

Page 4

... The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics. Specifications HCTS393MS GROUP (NOTES 1, 2) ...

Page 5

... AC measurements assume RL = 500 , CL = 50pF, Input 3ns, VIL = GND, VIH = 3V. 3. For functional tests VO 4.0V is recognized as a logic “1”, and VO TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25 PARAMETER ICC IOL/IOH Specifications HCTS393MS (NOTES 1, 2) CONDITIONS TEMPERATURE 0.5V is recognized as a logic “0”. GROUP B SUBGROUP ...

Page 6

... Each pin except VCC and GND will have a resistor of 1K OPEN NOTE: Each pin except VCC and GND will have a resistor of 47K Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures. Specifications HCTS393MS TABLE 6. APPLICABLE SUBGROUPS METHOD GROUP A SUBGROUPS 100%/5004 ...

Page 7

... Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (321) 724-7000 FAX: (321) 724-7240 HCTS393MS 100% Interim Electrical Test 1 (T1) 100% Delta Calculation (T0-T1) 100% Static Burn-In 2, Condition hrs. min., o +125 C min., Method 1015 ...

Page 8

... CP TW TPLH Qn VS FIGURE 1. CLOCK PRE-REQUISITE AND PROPAGATION DE- LAY, AND OUTPUT-TRANSITION TIMES TTLH VOH 80% 20% OUTPUT VOL FIGURE 3. OUTPUT TRANSITION TIME AC Load Circuit HCTS393MS INPUT LEVEL TPHL VS Qn FIGURE 2. MASTER RESET PRE-REQUISITE AND PROPAGA- TION DELAYS PARAMETER VCC VIH ...

Page 9

... Metallization Mask Layout (4) NOTE: The die diagram is a generic plot from a similar HCS device intended to indicate approximate die size and bond pad location. The mask series for the HCTS393 is TA14490A. HCTS393MS HCTS393MS 680 (11 (10 518633 Spec Number ...

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