k6r1016c1d Samsung Semiconductor, Inc., k6r1016c1d Datasheet - Page 5

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k6r1016c1d

Manufacturer Part Number
k6r1016c1d
Description
64kx16 Bit High-speed Cmos Static Ram 5.0v Operating . Operated At Commercial And Industrial Temperature Ranges.
Manufacturer
Samsung Semiconductor, Inc.
Datasheet

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K6R1016C1D
DC AND OPERATING CHARACTERISTICS*
* The above parameters are also guaranteed at industrial temperature range.
CAPACITANCE*
* Capacitance is sampled and not 100% tested.
AC CHARACTERISTICS
TEST CONDITIONS*
* The above test conditions are also applied at industrial temperature range.
Input/Output Capacitance
Input Capacitance
Input Pulse Levels
Input Rise and Fall Times
Input and Output timing Reference Levels
Output Loads
Input Leakage Current
Output Leakage Current
Operating Current
Standby Current
Output Low Voltage Level
Output High Voltage Level
D
Output Loads(A)
* Capacitive Load consists of all components of the
OUT
test environment.
Parameter
Item
Z
O
= 50Ω
(T
A
=25°C, f=1.0MHz)
Parameter
Symbol
V
I
V
I
I
I
SB1
I
CC
LO
SB
(T
OH
LI
OL
A
=0 to 70°C, V
Symbol
R
V
CS=V
V
Min. Cycle, 100% Duty
CS=V
Min. Cycle, CS=V
f=0MHz, CS≥V
V
I
I
L
C
OL
OH
C
IN
OUT
IN
= 50Ω
I/O
IN
=8mA
=V
≥V
=-4mA
=V
30pF*
IH
IL,
CC
SS
SS
or OE=V
V
-0.2V or V
to V
IN
CC
to V
=V
V
CC
L
=5.0V±10%, unless otherwise noted.)
IH
CC
CC
= 1.5V
or V
IH
-0.2V,
IH
Test Conditions
IN
or WE=V
(T
≤0.2V
- 5 -
IL,
A
Test Conditions
V
V
I
=0 to 70°C, Vcc=5.0V±10%, unless otherwise specified)
OUT
I/O
IN
=0V
=0V
=0mA
Output Loads(B)
for t
IL
HZ
, t
* Including Scope and Jig Capacitance
LZ
, t
WHZ
Com.
Ind.
, t
OW
D
255
TYP
OUT
-
-
, t
OLZ
See below
0V to 3V
Value
10ns
10ns
1.5V
& t
3ns
OHZ
PRELIMINARY
CMOS SRAM
Max
8
6
Min
2.4
-2
-2
-
-
-
-
-
+5.0V
480Ω
5pF*
Max
0.4
65
75
20
2
2
5
-
July 2004
Unit
pF
pF
Rev. 3.0
Unit
mA
mA
µA
µA
V
V

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