k6r1016c1d Samsung Semiconductor, Inc., k6r1016c1d Datasheet - Page 7
k6r1016c1d
Manufacturer Part Number
k6r1016c1d
Description
64kx16 Bit High-speed Cmos Static Ram 5.0v Operating . Operated At Commercial And Industrial Temperature Ranges.
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
1.K6R1016C1D.pdf
(11 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
k6r1016c1d-JC10
Manufacturer:
SAMSUNG
Quantity:
2 400
Company:
Part Number:
k6r1016c1d-JC10
Manufacturer:
SAMSUNG
Quantity:
642
Part Number:
k6r1016c1d-JC10
Manufacturer:
SAMSUNG/三星
Quantity:
20 000
Company:
Part Number:
k6r1016c1d-JI15
Manufacturer:
SST
Quantity:
2 000
Company:
Part Number:
k6r1016c1d-KC10
Manufacturer:
SAMSUNG
Quantity:
2 596
K6R1016C1D
Address
CS
UB, LB
OE
Data out
V
Current
TIMING WAVEFORM OF WRITE CYCLE(1)
TIMING WAVEFORM OF READ CYCLE(2)
CC
OE
Address
CS
UB, LB
WE
Data in
Data out
NOTES(READ CYCLE)
1. WE is high for read cycle.
2. All read cycle timing is referenced from the last valid address to the first transition address.
3. t
4. At any given temperature and voltage condition, t
5. Transition is measured ±200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested.
6. Device is continuously selected with CS=V
7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.
V
device.
HZ
OL
I
I
and t
levels.
CC
SB
OHZ
High-Z
are defined as the time at which the outputs achieve the open circuit condition and are not referenced to V
High-Z
t
t
PU
t
BLZ(4,5)
LZ(4,5)
t
AS(4)
t
OLZ
(WE=V
50%
(OE =Clock)
t
AA
t
CO
IL.
IH
t
t
BA
OE
)
t
OHZ(6)
- 7 -
HZ
(Max.) is less than t
t
RC
t
t
AW
t
WC
CW(3)
t
BW
t
WP(2)
Valid Data
LZ
(Min.) both for a given device and from device to
t
DW
Valid Data
t
WR(5)
t
PRELIMINARY
DH
50%
t
CMOS SRAM
PD
t
t
HZ(3,4,5)
t
BHZ(3,4,5)
t
DH
OHZ
High-Z
July 2004
Rev. 3.0
OH
or