mbn1200h45e2 CT-Concept Technologie AG, mbn1200h45e2 Datasheet - Page 2

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mbn1200h45e2

Manufacturer Part Number
mbn1200h45e2
Description
Silicon N-channel Igbt
Manufacturer
CT-Concept Technologie AG
Datasheet
IGBT MODULE
THERMAL CHARACTERISTICS
DEFINITION OF TEST CIRCUIT
Thermal Impedance
Contact Thermal Impedance
MBN1200H45E2
0
0
Item
Eon(10%)=
Eon(Full) =
Vce
10%
IGBT
FWD
90%
10%
t1
t3
ton
tr
t4
t4
t3
t2
t1
10%
I c ・ V c e d t
t2
I c ・ V c e d t
Vge
Ic
Fig.3 Definition of switching loss
0
Symbol
Rth(j-c)
Rth(j-c)
Rth(c-f)
Vcc
Vce
t
t
Fig.1 Switching test circuit
Fig.2 Definition of Ls
0
0
Unit
K/W
K/W
Vge
Eoff(10%)=
Eoff(Full) =
Ic
tL
90%
10%
G/D
VL
t5
Min.
-
-
-
t7
Ic
toff
Ls
tf
90%
Rg
t8
t7
0.005
t6
t5
t8
Typ.
I c ・ V c e d t
I c ・ V c e d t
-
-
10%
t
t6
0.0085
Max.
0.017
Vce
-
Ls=
t
t
Junction to case
Case to fin (λgrease=1W/(m
( )
heat-sink flatness ≤50um)
dIc
d
0
V
Target
-Ic
L
L
Err(10%)=
Err(Full) =
LOAD
t=t
Test Conditions
Spec.No.IGBT-SP-08007 R3 P
L
IF
Specification
Irm
0.1Vce
t9
t10
t9
t12
t11
t11
I F ・ V c e d t
I F ・ V c e d t
trr
t12
0.5Irm
Vce
0.1IF
K ),
t10
t
2

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