SST29EE010-70-4C-EH SST [Silicon Storage Technology, Inc], SST29EE010-70-4C-EH Datasheet - Page 18

• Manufacturer Part Number: SST29EE010-70-4C-EH
• Description: 1 Mbit (128K x8) Page-Write EEPROM
• Manufacturer: SST [Silicon Storage Technology, Inc]

Data Sheet
©2005 Silicon Storage Technology, Inc.
AC test inputs are driven at V
inputs and outputs are V
FIGURE 13: AC I
FIGURE 14: A T
V IHT
V ILT
TO DUT
EST
NPUT
L
INPUT
HT
OAD
/O
(2.0 V) and V
UTPUT
IHT
E
XAMPLE
(2.4V) for a logic “1” and V
R
EFERENCE
LT
V HT
V LT
(0.8 V). Input rise and fall times (10%
C L
W
TO TESTER
AVEFORMS
REFERENCE POINTS
18
ILT
R L LOW
(0.4 V) for a logic “0”. Measurement reference points for
V HT
V LT
1 Mbit Page-Write EEPROM
SST29EE010 / SST29VE010
↔
90%) are <10 ns.
1061 F14.0
V DD
R L HIGH
OUTPUT
Note: V
1061 F13.0
V
V
V
LT
IHT
ILT
HT
- V
- V
- V
- V
S71061-11-000
LOW
HIGH
INPUT
INPUT
Test
Test
LOW Test
HIGH Test
9/05