DS1020-50 DALLAS [Dallas Semiconductor], DS1020-50 Datasheet - Page 5

• Manufacturer Part Number: DS1020-50
• Description: Programmable 8-Bit Silicon Delay Line
• Manufacturer: DALLAS [Dallas Semiconductor]

DALLAS SEMICONDUCTOR TEST CIRCUIT Figure 4
TEST SETUP DESCRIPTION
Figure 4 illustrates the hardware configuration used for measuring the timing parameters of the DS1021.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected to the output. The DS1021 serial and
parallel ports are controlled by interfaces to a central computer. All measurements are fully automated
with each instrument controlled by the computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature:
Supply Voltage (V
Input Pulse:
Source Impedance:
Rise and Fall Time:
Pulse Width:
Period:
NOTE: Above conditions are for test only and do not restrict the operation of the device under other data
OUTPUT:
Output is loaded with a 74F04. Delay is measured between the 1.5V level of the rising edge of the input
signal and the 1.5V level of the corresponding edge of the output.
sheet conditions.
CC
):
25°C ± 3°C
5.0V ± 0.1V
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
50 ohms max.
3.0 ns max.
(measured between 0.6V and 2.4V)
500 ns (DS1021–25)
2 µs (DS1021–50)
1 µs (DS1021–25)
4 µs (DS1021–50)
DS1021
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