STQ-1016Z ETC1 [List of Unclassifed Manufacturers], STQ-1016Z Datasheet
STQ-1016Z
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STQ-1016Z Summary of contents
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... Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall be entirely at the user’s own risk. Data subject to change. 303 S. Technology Ct, Broomfield CO, 80021 Products Qualified by Similarity STQ-1016Z SRF-1016Z SRQ-2116Z STQ-3016Z SRF-2016Z Phone: (800) SMI-MMIC http://www.sirenza.com ...
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... The STQ-2016Z family of products has demonstrated reliable operation by passing all qualification testing in Sirenza Microdevices' product qualification test plan. The STQ-2016Z has been subject to stresses such as humidity (autoclave), extreme hot and cold environments (temperature cycling), moisture sensitivity (MSL-1 and solder reflow testing), and several others as part of the qualification process. ...
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... A device can be qualified by similarity to previously qualified products provided that no new potential failure modes/mechanisms are possible in the new design. The following products have been qualified by similarity to STQ-2016Z: STQ-1016Z STQ-3016Z SRF-1016Z SRF-2016Z SRQ-2116Z VII. Operational Life Testing Sirenza Microdevices defines operational life testing biased elevated temperature test performed at the maximum operational junction temperature limit ...
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... JESD22-A113B Moisture Sensitivity Level 1 (MSL-1). MSL-1 indicates that no special dry pack requirements or time limits from opening of static bag to reflow exist for the STQ-2016Z. MSL-1 is highest level of moisture resistance that a device can be classified according to the above mentioned standard ...
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... STQ-2016Z Reliability Qualification Report Group Test Name B Preconditioning B1a Temperature Cycling High Temperature B1b Operating Life B1c HAST Power Temperature B1d Cycle B2 Autoclave B3 Temperature Cycle XI. Qualification Test Results Test Condition/ Standard MSL1 o Reflow @ 270 C Peak JESD22-A113C Air to Air, Soldered on PCB o o -65 ...
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... STQ-2016Z Reliability Qualification Report Group Test Name Low Temperature C Storage High Temperature D Storage G Solderability F Tin Whisker XI. Qualification Test Results Test Condition/ Standard T =-40°C amb 1000 hours T =-65°C amb 1000 hours T =150°C amb 1000 hours JESD22-A103B Dip & Look Steam Age Condition C Dip Condition A, 215° ...
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... The results are displayed below for the STQ-2016Z device running at operational current of Id= 80mA, a device voltage of 5V, and lead temperature of 85°C. Figure 2: Infrared Thermal Image of STQ-2016Z 5.0V, Id =80mA 98°C ...
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Figure 3: Infrared Thermal Image of SRQ-2116Z 5.0V, Id =157mA 103.8°C ...
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... In reality, there were no failures, making this a very conservative calculation. Activation Energy (eV) FIT (per Table 3: Activation Energy and calculated FIT for STQ-2016Z The FIT rate calculation can be found below. The FIT 9 dev-hours) o ...