STQ3016Z ETC, STQ3016Z Datasheet
STQ3016Z
Related parts for STQ3016Z
STQ3016Z Summary of contents
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Reliability Qualification Report STQ-2016Z - Matte Sn, RoHS compliant The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this ...
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STQ-2016Z Reliability Qualification Report I. Qualification Overview The STQ-2016Z family of products has demonstrated reliable operation by passing all qualification testing in Sirenza Microdevices' product qualification test plan. The STQ-2016Z has been subject to stresses such as humidity (autoclave), extreme ...
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STQ-2016Z Reliability Qualification Report V. Qualification Methodology The Sirenza Microdevices qualification process consists of a series of tests designed to stress various potential failure mechanisms. This testing is performed to ensure that Sirenza Microdevices products are robust against potential failure ...
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STQ-2016Z Reliability Qualification Report VIII. Moisture Sensitivity Level - MSL Level 1 Device STQ-2016Z has successfully completed 168 hours of moisture soak (85 followed by three convection reflow cycles with a peak temperature of 270 successful completion of this test ...
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STQ-2016Z Reliability Qualification Report Group Test Name B Preconditioning B1a Temperature Cycling High Temperature B1b Operating Life B1c HAST Power Temperature B1d Cycle B2 Autoclave B3 Temperature Cycle www.DataSheet4U.com XI. Qualification Test Results Test Condition/ Standard MSL1 o Reflow @ ...
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STQ-2016Z Reliability Qualification Report Group Test Name Low Temperature C Storage High Temperature D Storage G Solderability F Tin Whisker www.DataSheet4U.com XI. Qualification Test Results Test Condition/ Standard T =-40°C amb 1000 hours T =-65°C amb 1000 hours T =150°C ...
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STQ-2016Z Reliability Qualification Report XII. Junction Temperature Determination One key issue in performing qualification testing is to accurately determine the junction temperature of the device. Sirenza Microdevices uses a 3um spot size emissivity corrected infrared camera measurement to resolve the ...
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Figure 3: Infrared Thermal Image of SRQ-2116Z 5.0V, Id =157mA 103.8°C www.DataSheet4U.com ...
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STQ-2016Z Reliability Qualification Report XIII. FIT Calculation from Accelerated Life Test Data The following data demonstrates the results from accelerated life tests performed on the Sirenza 4A SiGe HBT Process. The test was performed on 791 units running at a ...