acfm-7101 Avago Technologies, acfm-7101 Datasheet - Page 5

• Manufacturer Part Number: acfm-7101
• Description: Pcs/cellular/gps Quintplexer
• Manufacturer: Avago Technologies

Absolute Maximum Ratings
Maximum Recommended Operating Conditions
Characterization
A test circuit similar to that shown in Figure 1 was used to
measure typical device performance. This circuit is designed
to interface with Air Coplanar (ACP), Ground-Signal-Ground
(GSG) RF probes of the type commonly used to test
semiconductor wafers.
Figure 1. ACP Probe Test Circuit.
The test circuit is a 17.7 x 17.7 mm PCB with a well-
grounded pad to which the device under test (DUT) is
solder-mounted.
Notes:
1. Operation in excess of any one of these conditions may result in permanent damage to the device.
2. The device will function over the recommended range without degradation in reliability or permanent change in performance, but is
3. T
Storage temperature
Maximum RF Input Power to Tx Ports
Operating temperature, Tc
Operating temperature, Tc
not guaranteed to meet electrical specifications.
C
is defined as case temperature, the temperature of the underside of the quintplexer where it makes contact with the circuit board.
[1]
[3]
[3]
Parameter
Parameter
, Tx Power 29 dBm
, Tx Power 30 dBm
[2]
Short lengths of 50-ohm microstripline connect the DUT to
ACP probe patterns on the board.
A test circuit with a ACFM-7101 mounted in place is shown
in Figure 2. S-parameters are then measured using a
network analyzer and calibrated ACP probe set.
Figure 2. Test Circuit with ACFM-7101 Quintplexer.
Phase data for s-parameters measured with ACP probe
circuits are adjusted to place the reference plane at the edge
of the quintplexer.
dBm
Unit
Unit
°C
°C
°C
–65 to +125
–40 to +100
–40 to +85
Value
Value
+33
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