AD590_02 INTERSIL [Intersil Corporation], AD590_02 Datasheet - Page 5

• Manufacturer Part Number: AD590_02
• Description: 2-Wire, Current Output Temperature Transducer
• Manufacturer: INTERSIL [Intersil Corporation]

J Grade Maximum Errors (
NOTE:
10. Less than ±0.05
NOTES
Trim Error is usually the largest error source. This error
arises from such causes as poor thermal coupling between
the device to be calibrated and the reference sensor; refer-
ence sensor errors; lack of adequate time for the device
being calibrated to settle to the final temperature; radically
different thermal resistances between the case and the sur-
roundings (R θ
None
None
None
None
None
None
One
One
One
One
One
One
Two
Two
Two
Two
Two
Two
1. Maximum errors over all ranges are guaranteed based on
2. For one-trim accuracy specifications, the 205
3. For the 205
4. In precision applications, the actual errors encountered
NUMBER OF
a. Trim error in the calibration technique used
b. Repeatability error
c. Long term drift errors
the known behavior characteristic of the AD590.
assumed to be trimmed at 25
assumed that the device is trimmed at the midpoint.
temperatures are in the vicinity of 0
other spans, the specified trims are at the endpoints.
are usually dependent upon sources of error which are
often overlooked in error budgets. These typically
include:
TRIMS
CA
o
C span, it is assumed that the two-trim
) when trimming and when applying the
o
C.
TEMPERATURE
SPAN (
100
150
205
100
150
205
100
150
205
10
25
50
10
25
50
10
25
50
o
C)
o
C)
o
C; for all other spans, it is
o
C and 140
10.0
-55
4.2
5.0
6.5
7.7
9.2
0.3
0.9
1.9
2.3
2.5
3.0
0.1
0.2
0.4
0.7
1.0
1.6
o
C span is
o
(Note 10)
C; for all
-25
4.6
5.2
6.5
8.0
9.5
0.2
0.6
1.5
2.2
2.4
0.1
0.2
0.5
0.7
-
-
-
AD590
5
(Note 10)
(Note 10)
LOWEST TEMPERATURE IN SPAN (× o C)
device.
Repeatability Errors arise from a strain hysteresis of the
package. The magnitude of this error is solely a function of
the magnitude of the temperature span over which the
device is used. For example, thermal shocks between 0
and 100
repeatability errors of less than ±0.05
shock excursion is widened to -55
will typIcally exhibit a repeatability error of ±0.05
guaranteed maximum).
Long Term Drift Errors are related to the average operat-
ing temperature and the magnitude of the thermal-shocks
experienced by the device. Extended use of the AD590 at
temperatures above 100
of ±0.03
per month. Continuous operation at temperatures below
100
the effects of operating temperature, the severity of thermal
shocks incurred will also affect absolute stability. For
thermal-shock excursions less than 100
cult to measure (<0.03
the device may drift by as much as ±0.10
such shocks. If severe, quick shocks are necessary in the
application of the device, realistic simulated life tests are rec-
ommended for a thorough evaluation of the error introduced
5.0
5.5
6.4
8.3
9.6
0.2
0.5
1.0
2.0
2.5
0.1
0.3
1.2
0
-
-
-
o
C induces no measurable drifts in the device. Besides
o
o
(Note 10)
(Note 10)
(Note 10)
C per month; the guaranteed maximum is ±0.10
C involve extremely low hysteresis and result in
5.4
5.9
6.9
8.7
0.2
0.5
1.0
2.0
0.7
25
-
-
-
-
-
-
(Note 10)
(Note 10)
(Note 10)
5.8
6.0
7.3
9.4
0.2
0.5
1.0
2.3
1.0
50
o
-
-
-
-
-
-
C). However, for 200
o
C typically results in long-term drift
(Note 10)
(Note 10)
6.2
6.9
8.2
0.2
0.6
1.5
0.1
75
-
-
-
-
-
-
-
-
-
o
C to 150
o
C. When the thermal-
(Note 10)
o
C, the drift is diffi-
100
6.6
7.5
9.0
0.2
0.8
1.9
0.1
0.2
-
-
-
-
-
-
-
-
-
o
o
o
C after twenty
C, the device
C excursions,
o
(Note 10)
C (±0.10
125
7.2
8.0
0.3
0.9
0.1
0.2
-
-
-
-
-
-
-
-
-
-
-
o
o
C
C