AT24C02A ATMEL [ATMEL Corporation], AT24C02A Datasheet - Page 2

• Manufacturer Part Number: AT24C02A
• Description: 2-Wire Serial EEPROM
• Manufacturer: ATMEL [ATMEL Corporation]

Absolute Maximum Ratings*
Block Diagram
Pin Description
SERIAL CLOCK (SCL): The SCL input is used to positive
edge clock data into each EEPROM device and negative
edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for
serial data transfer. This pin is open-drain driven and may
be wire-ORed with any number of other open-drain or open
collector devices.
DEVICE/PAGE ADDRESSES (A2, A1, A0): The A2, A1
and A0 pins are device address inputs that are hard wired
for the AT24C02A. As many as eight 2K devices may be
addressed on a single bus system (device addressing is
discussed in detail under the Device Addressing section).
2
Operating Temperature .................................. -55 C to +125 C
Storage Temperature ..................................... -65 C to +150 C
Voltage on Any Pin
with Respect to Ground .....................................-1.0V to +7.0V
Maximum Operating Voltage........................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT24C02A/04A/08A
The AT24C04A uses the A2 and A1 inputs for hard wire
addressing and a total of four 4K devices may be
addressed on a single bus system. The A0 pin is a no con-
nect.
The AT24C08A only uses the A2 input for hardwire
addr es si ng a nd a total of two 8K de vi ces ma y be
addressed on a single bus system. The A0 and A1 pins are
no connects.
WRITE PROTECT (WP): The AT24C02A/04A/08A has a
Write Protect pin that provides hardware data protection.
The Write Protect pin allows normal read/write operations
when connected to ground (GND). When the Write Protect
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.