CY14E064L CYPRESS [Cypress Semiconductor], CY14E064L Datasheet - Page 8
CY14E064L
Manufacturer Part Number
CY14E064L
Description
64-Kbit (8K x 8) nvSRAM
Manufacturer
CYPRESS [Cypress Semiconductor]
Datasheet
1.CY14E064L.pdf
(16 pages)
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Document #: 001-06543 Rev. *C
AC Test Loads
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Thermal Resistance
Parameter
Θ
Θ
JC
JA
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Description
[3]
OUTPUT
Test conditions follow standard test methods and procedures
for measuring thermal impedance, per EIA / JESD51.
5.0V
PRELIMINARY
30 pF
Test Conditions
R1 480Ω
255Ω
R2
28-SOIC
TBD
TBD
CY14E064L
Page 8 of 16
°C/W
°C/W
Unit
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