ATA555811-DDT ATMEL [ATMEL Corporation], ATA555811-DDT Datasheet - Page 37

• Manufacturer Part Number: ATA555811-DDT
• Description: 1 kbit R/W IDIC with Deterministic Anticollision
• Manufacturer: ATMEL [ATMEL Corporation]

9. Electrical Characteristics (Continued)
T
4681C–RFID–09/05
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes:
amb
No. Parameters
9.1
9.2
9.3
10
7
8
= +25°C; f
Programming time
Endurance
Data retention
Resonance capacitor
1. EEPROM device performance can be influenced by subsequent customer assembly processes especially if subjected to
2. Current into Coil 1/Coil 2 is limited to 10 mA. The damping characteristics are defined by the internally limited supply volt-
3. I
4. V
5. The tolerance of the on-chip resonance capacitor is ±10% at 3s over whole production. The capacitor tolerance is
high temperatures or mechanical stress conditions. So Atmel confirms these parameters only for devices as they leave the
Atmel production, as undiced wafers or diced wafers in tray, etc.
age (= minimum AC coil voltage).
I
±3% at 3 on a wafer basis.
DD
DD
mod
coil
measurement setup R = 100 k ; V
= (V
= 125 kHz; unless otherwise specified
measurement setup: R = 2.3 k ; V
OUTmax
– V
Figure 9-1.
CLK
)/R
Test Conditions
From last command gap to
SOF pattern
(36 + 648 internal clocks)
Erase all/Write all
Top = 55 C
Top = 150 C
Top = 250 C
Mask option
V
CLK
Measurement Setup for V
(1)
(5)
(1)
(1)
CLK
R
CLK
(1)
+
= V
-
= 3 V; setup with modulation enabled (see
coil
= 5 V: EEPROM programmed to 00 ... 000 (erase all); NRZ, public mode.
Cr
Symbol
t
t
t
retention
retention
retention
n
T
cycle
prog
mod
70
100000
750
750
Min.
BAT68
BAT68
ATA5558 [Preliminary]
10
96
24
5
78
Typ.
5.7
20
Figure 9-1 on page
Coil 1
ATA5558
Coil 2
86
Max.
50
6
Substrate
pF
Cycles
Years
37).
Unit
ms
hrs
hrs
T
Type*
Q
Q
T
T
37