AT25128-10CC ATMEL Corporation, AT25128-10CC Datasheet - Page 2
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AT25128-10CC
Manufacturer Part Number
AT25128-10CC
Description
SPI Serial EEPROMs
Manufacturer
ATMEL Corporation
Datasheet
1.AT25128-10CC.pdf
(17 pages)
space saving 8-pin PDIP (AT25128/256), 8-pin EIAJ SOIC
(AT25128/256), 8-pin and 16-pin JEDEC SOIC (AT25128),
14-pin TSSOP (AT25128), 20-pin TSSOP (AT25128/256),
and 8-pin Leadless Array (AT25128/256) packages. In
addition, the entire family is available in 5.0V (4.5V to
5.5V), 2.7V (2.7V to 5.5V) and 1.8V (1.8V to 3.6V) ver-
sions.
The AT25128/256 is enabled through the Chip Select pin
(CS) and accessed via a 3-wire interface consisting of
Serial Data Input (SI), Serial Data Output (SO), and Serial
Clock (SCK). All programming cycles are completely self-
timed, and no separate ERASE cycle is required before
WRITE.
BLOCK WRITE protection is enabled by programming the
status register with top ¼, top ½ or entire array of write pro-
tection. Separate program enable and program disable
instructions are provided for additional data protection.
Hardware data protection is provided via the WP pin to pro-
tect against inadvertent write attempts to the status regis-
Block Diagram
2
AT25128/256
16384/32768 x 8
ter. The HOLD pin may be used to suspend any serial
communication without resetting the serial sequence.
Absolute Maximum Ratings*
*NOTICE:
Operating Temperature .................................. -55 C to +125 C
Storage Temperature ..................................... -65 C to +150 C
Voltage on Any Pin
with Respect to Ground .................................... -1.0V to +7.0V
Maximum Operating Voltage........................................... 6.25V
DC Output Current ........................................................ 5.0 mA
Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional
operation of the device at these or any other condi-
tions beyond those indicated in the operational sec-
tions of this specification is not implied. Exposure to
absolute maximum rating conditions for extended
periods may affect device reliability.