AM29F100B-120DGC Advanced Micro Devices, AM29F100B-120DGC Datasheet - Page 23

• Manufacturer Part Number: AM29F100B-120DGC
• Description: 1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS 5.0 Volt-only/ Boot Sector Flash Memory-Die Revision 1
• Manufacturer: Advanced Micro Devices

TEST CONDITIONS
KEY TO SWITCHING WAVEFORMS
Note: Diodes are IN3064 or equivalent
Device
Under
Test
WAVEFORM
Figure 8. Test Setup
C L
Don’t Care, Any Change Permitted
6.2 k
Does Not Apply
5.0 V
INPUTS
18926C-13
2.7 k
Am29F100
Changing from H to L
Changing from L to H
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
Steady
Test Condition
Center Line is High Impedance State (High Z)
Table 7. Test Specifications
Changing, State Unknown
OUTPUTS
L
0.0–3.0
-70
1.5
1.5
30
5
1 TTL gate
All others Unit
0.45–2.4
100
KS000010-PAL
0.8
2.0
20
pF
ns
V
V
V
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