K6X4016C3F-B Samsung semiconductor, K6X4016C3F-B Datasheet - Page 8

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K6X4016C3F-B

Manufacturer Part Number
K6X4016C3F-B
Description
256Kx16 bit Low Power full CMOS Static RAM
Manufacturer
Samsung semiconductor
Datasheet
K6X4016C3F Family
DATA RETENTION WAVE FORM
CS controlled
TIMING WAVEFORM OF WRITE CYCLE(3)
Address
CS
UB, LB
WE
Data in
Data out
NOTES (WRITE CYCLE)
1. A wri
2. t
3. t
4. t
V
4.5V
2.2V
V
CS
GND
CC
DR
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-
tion when CS goes high and WE goes high. The t
CW
AS
WR
is measured from the address valid to the beginning of write.
is measured from the CS going low to the end of write.
is measured from the end of write to the address change. t
t
e occurs during the overlap(t
WP
) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB
High-Z
t
SDR
t
AS(3)
WP
(UB, LB Controlled)
is measured from the beginning of write to the end of write.
8
WR
Data Retention Mode
applied in case a write ends as CS or WE going high.
CS V
t
t
AW
CW(2)
t
WC
t
BW
t
CC
WP(1)
- 0.2V
t
DW
Data Valid
t
WR(4)
t
DH
CMOS SRAM
High-Z
t
RDR
September 2003
Revision 1.0

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