BS62LV8001DC55 BSI [Brilliance Semiconductor], BS62LV8001DC55 Datasheet - Page 7
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BS62LV8001DC55
Manufacturer Part Number
BS62LV8001DC55
Description
Very Low Power CMOS SRAM 1M X 8 bit
Manufacturer
BSI [Brilliance Semiconductor]
Datasheet
1.BS62LV8001DC55.pdf
(10 pages)
R0201-BS62LV8001
WRITE CYCLE 2
NOTES:
1. WE must be high during address transitions.
2. The internal write time of the memory is defined by the overlap of CE1 and CE2 active and
3. t
4. During this period, DQ pins are in the output state so that the input signals of opposite
5. If the CE1 low transition or the CE2 high transition occurs simultaneously with the WE low
6. OE is continuously low (OE = V
7. D
8. D
9. If CE1 is low and CE2 is high during this period, DQ pins are in the output state. Then the
10. Transition is measured ± 500mV from steady state with C
11. t
WE low. All signals must be active to initiate a write and any one signal can terminate a
write by going inactive. The data input setup and hold timing should be referenced to the
second transition edge of the signal that terminates the write.
write cycle.
phase to the outputs must not be applied.
transitions or after the WE transition, output remain in a high impedance state.
data input signals of opposite phase to the outputs must not be applied to them.
The parameter is guaranteed but not 100% tested.
WR
CW
OUT
OUT
is measured from the later of CE1 going low or CE2 going high to the end of write.
is measured from the earlier of CE1 or WE going high or CE2 going low at the end of
is the same phase of write data of this write cycle.
is the read data of next address.
ADDRESS
CE1
CE2
WE
D
D
OUT
IN
(1,6)
IL
).
t
AS
L
= 5pF.
(5)
(5)
t
WHZ
7
(4,10)
t
AW
t
t
t
CW
CW
WP
t
WC
(11)
(11)
(2)
t
DW
t
WR2
t
t
OW
DH
(3)
BS62LV8001
(8,9)
(7)
Revision
May.
(8)
2006
2.3