ZL50060 ZARLINK [Zarlink Semiconductor Inc], ZL50060 Datasheet - Page 50
ZL50060
Manufacturer Part Number
ZL50060
Description
16 K-Channel Digital Switch with High Jitter Tolerance, Per Stream Rate Conversion (2, 4, 8, 16, or 32 Mbps), and 64 Inputs and 64 Outputs
Manufacturer
ZARLINK [Zarlink Semiconductor Inc]
Datasheet
1.ZL50060.pdf
(99 pages)
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11.2
The ZL50060/1 implements the public instructions defined in the IEEE-1149.1 standard with the provision of an
Instruction Register and three Test Data Registers.
11.2.1
The JTAG interface contains a four-bit instruction register. Instructions are serially loaded into the Instruction
Register from the TDi pin when the TAP Controller is in the shift-IR state. Instructions are subsequently decoded to
achieve two basic functions: to select the Test Data Register to operate while the instruction is current, and to
define the serial Test Data Register path to shift data between TDi and TDo during data register scanning. Please
refer to Figure 34 for JTAG test port timing.
11.2.2
11.2.2.1
The Boundary-Scan register consists of a series of Boundary-Scan cells arranged to form a scan path around the
boundary of the ZL50060/1 core logic.
11.2.2.2
The Bypass register is a single stage shift register to provide a one-bit path from TDi to TDo.
11.2.2.3
The JTAG device ID for the ZL50060/1 is 0C38D14B
Version, Bits <31:28>:0000
Part No., Bits <27:12>:1100 0011 1000 1101
Manufacturer ID, Bits <11:1>:0001 0100 101
Header, Bit <0> (LSB):1
11.3
A Boundary Scan Description Language (BSDL) file is available from Zarlink Semiconductor to aid in the use of the
IEEE 1149.1 test interface.
falling edge of the TCK pulses. When no data is shifted through the boundary scan cells, the TDo output is
set to a high impedance state.
Test Reset (TRST)
TRST provides an asynchronous Reset to the JTAG scan structure. This pin is internally pulled high when
not driven from an external source. This pin MUST be pulled low for normal operation.
TAP Registers
Boundary Scan Description Language (BSDL) File
Test Instruction Register
Test Data Registers
The Device Identification Register
The Boundary-Scan Register
The Bypass Register
Zarlink Semiconductor Inc.
ZL50060/1
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50
Data Sheet
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