HS9-1840BRH INTERSIL [Intersil Corporation], HS9-1840BRH Datasheet - Page 4

• Manufacturer Part Number: HS9-1840BRH
• Description: Rad-Hard 16 Channel BiCMOS Analog Multiplexer with High-Z Analog Input Protection
• Manufacturer: INTERSIL [Intersil Corporation]

Burn-In/Life Test Circuits
NOTES:
Irradiation Circuit
NOTE:
+V
1. The above test circuits are utilized for all package types.
2. The Dynamic Test Circuit is utilized for all life testing.
3. All irradiation testing is performed in the 28 lead CERDIP package.
GND
NOTE:
V
R = 1kΩ ±5%.
C
D
INPUT SIGNALS:
SQUARE WAVE, 50% DUTY CYCLE, 0V TO 15V PEAK ±10%.
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16.
F4
S
1
1
S
+ = +15.5V ±0.5V, V
= C
= D
2
2
FIGURE 1. DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
= 0.01µF ±10%, 1 EACH PER SOCKET, MINIMUM.
= 1N4002, 1 EACH PER BOARD, MINIMUM.
HS-1840ARH, HS-1840AEH, HS-1840BRH, HS-1840BEH
R
S
- = -15.5V ±0.5V.
10
11
12
13
14
1
2
3
4
5
6
7
8
9
4
28
27
26
25
24
23
22
21
20
19
18
17
16
15
+15V
+1V
+5V
NC
NC
R
HS-1840ARH, HS-1840AEH, HS-1840BRH
R
F1
F3
10
11
12
13
14
1
2
3
4
5
6
7
8
9
-V
F5
F2
S
+V
V
GND
R
S
NOTE:
R = 1kΩ ±5%, 1/4W.
C
V
28
27
26
25
24
23
22
21
20
19
18
17
16
15
S
1
+ = 15.5V ±0.5V, V
= C
R
2
FIGURE 2. .STATIC BURN-IN TEST CIRCUIT
= 0.01µF MINIMUM, 1 EACH PER SOCKET, MINIMUM.
R
-15V
10
11
12
13
14
1
2
3
4
5
6
7
8
9
S
- = -15.5V ±0.5V, V
1kΩ
28
27
26
25
24
23
22
21
20
19
18
17
16
15
R
= 15.5 ±0.5V
R
R
April 6, 2012
FN4355.5
-V
S