CY7C1412KV18-333BZXI Cypress Semiconductor, CY7C1412KV18-333BZXI Datasheet

no-image

CY7C1412KV18-333BZXI

Manufacturer Part Number
CY7C1412KV18-333BZXI
Description
SRAM 36MB (2Mx18) 1.8v 333MHz QDR II SRAM
Manufacturer
Cypress Semiconductor
Datasheet

Specifications of CY7C1412KV18-333BZXI

Rohs
yes
Memory Size
36 MB
Organization
2 M x 18
Access Time
30 ns
Supply Voltage - Max
1.9 V
Supply Voltage - Min
1.7 V
Maximum Operating Current
750 mA
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
FBGA-165
Factory Pack Quantity
136

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1412KV18-333BZXI
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
36-Mbit QDR
Features
Selection Guide
Cypress Semiconductor Corporation
Document Number: 001-57825 Rev. *F
Maximum operating frequency
Maximum operating current
Separate independent read and write data ports
333 MHz clock for high bandwidth
2-word burst on all accesses
Double data rate (DDR) Interfaces on both read and write ports
(data transferred at 666 MHz) at 333 MHz
Two input clocks (K and K) for precise DDR timing
Two input clocks for output data (C and C) to minimize clock
skew and flight time mismatches
Echo clocks (CQ and CQ) simplify data capture in high speed
systems
Single multiplexed address input bus latches address inputs
for both read and write ports
Separate port selects for depth expansion
Synchronous internally self-timed writes
QDR
asserted HIGH
Operates similar to QDR I device with 1 cycle read latency when
DOFF is asserted LOW
Available in × 9, × 18, and × 36 configurations
Full data coherency, providing most current data
Core V
Available in 165-ball FBGA package (13 × 15 × 1.4 mm)
Offered in both Pb-free and non Pb-free Packages
Variable drive HSTL output buffers
JTAG 1149.1 compatible test access port
Phase locked loop (PLL) for accurate data placement
®
II SRAM 2-Word Burst Architecture
Supports concurrent transactions
SRAM uses rising edges only
Supports both 1.5 V and 1.8 V I/O supply
®
DD
II operates with 1.5 cycle read latency when DOFF is
= 1.8 V (±0.1 V); I/O V
DDQ
Description
= 1.4 V to V
198 Champion Court
DD
36-Mbit QDR
Configurations
CY7C1425KV18 – 4 M × 9
CY7C1412KV18 – 2 M × 18
CY7C1414KV18 – 1 M × 36
Functional Description
The CY7C1425KV18, CY7C1412KV18, and CY7C1414KV18
are 1.8 V synchronous pipelined SRAMs, equipped with QDR II
architecture. QDR II architecture consists of two separate ports:
the read port and the write port to access the memory array. The
read port has dedicated data outputs to support read operations
and the write port has dedicated data inputs to support write
operations. QDR II architecture has separate data inputs and
data outputs to completely eliminate the need to “turnaround” the
data bus that exists with common I/O devices. Access to each
port is through a common address bus. Addresses for read and
write addresses are latched on alternate rising edges of the input
(K) clock. Accesses to the QDR II read and write ports are
completely independent of one another. To maximize data
throughput, both read and write ports are equipped with DDR
interfaces. Each address location is associated with two 9-bit
words (CY7C1425KV18), 18-bit words (CY7C1412KV18), or
36-bit words (CY7C1414KV18) that burst sequentially into or out
of the device. Because data can be transferred into and out of
the device on every rising edge of both input clocks (K and K and
C and C), memory bandwidth is maximized while simplifying
system design by eliminating bus turnarounds.
Depth expansion is accomplished with port selects, which
enables each port to operate independently.
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
CY7C1412KV18, CY7C1414KV18
San Jose
× 18
× 36
× 9
333 MHz
,
CA 95134-1709
333
730
750
910
®
Burst Architecture
II SRAM 2-Word
300 MHz
300
680
700
850
CY7C1425KV18
Revised March 13, 2012
250 MHz
250
590
610
730
408-943-2600
MHz
Unit
mA

Related parts for CY7C1412KV18-333BZXI

CY7C1412KV18-333BZXI Summary of contents

Page 1

... To maximize data throughput, both read and write ports are equipped with DDR interfaces. Each address location is associated with two 9-bit words (CY7C1425KV18), 18-bit words (CY7C1412KV18), or 36-bit words (CY7C1414KV18) that burst sequentially into or out of the device. Because data can be transferred into and out of ...

Page 2

... Logic Block Diagram – CY7C1425KV18 9 D [8:0] 21 Address A (20:0) Register K CLK K Gen. DOFF V REF Control WPS Logic BWS [0] Logic Block Diagram – CY7C1412KV18 18 D [17:0] 20 Address A (19:0) Register K CLK K Gen. DOFF V REF Control WPS Logic BWS [1:0] Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Write Write Address ...

Page 3

... Logic Block Diagram – CY7C1414KV18 36 D [35:0] 19 Address A (18:0) Register K CLK K Gen. DOFF V REF Control WPS Logic BWS [3:0] Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Write Write Address Reg Reg Register Control Logic Read Data Reg Reg. Reg. 36 Reg. CY7C1425KV18 19 A (18:0) RPS ...

Page 4

... TAP Controller Block Diagram ...................................... 16 TAP Electrical Characteristics ...................................... 16 TAP AC Switching Characteristics ............................... 17 TAP Timing and Test Conditions .................................. 18 Identification Register Definitions ................................ 19 Document Number: 001-57825 Rev. *F CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 Scan Register Sizes ....................................................... 19 Instruction Codes ........................................................... 19 Boundary Scan Order .................................................... 20 Power Up Sequence in QDR II SRAM ........................... 21 Power Up Sequence ................................................. 21 PLL Constraints ......................................................... 21 Maximum Ratings ...

Page 5

... Pin Configurations The pin configurations for CY7C1425KV18, CY7C1412KV18, and CY7C1414KV18 follow NC/72M DOFF V V REF DDQ ...

Page 6

... Pin Configurations (continued) The pin configurations for CY7C1425KV18, CY7C1412KV18, and CY7C1414KV18 follow NC/144M D10 D NC D11 Q10 Q11 F NC Q12 D12 G NC D13 Q13 H DOFF V V REF DDQ D14 Q14 L NC Q15 ...

Page 7

... Internally, the device is organized × arrays each × 9) for CY7C1425KV18 × arrays each × 18) for CY7C1412KV18, and 1 M × arrays each of 512 K × 36) for CY7C1414KV18. Therefore, only 21 address inputs are needed to access the entire memory array of CY7C1425KV18, 20 address inputs for CY7C1412KV18, and 19 address inputs for CY7C1414KV18 ...

Page 8

... DD V Ground Ground for the device Power supply Power supply inputs for the outputs of the device. DDQ Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Pin Description output impedance are set to 0.2 × RQ, where resistor [x:0] CY7C1425KV18 , which enables the DDQ Page ...

Page 9

... K clock rise. [x:0] Depth Expansion The CY7C1412KV18 has a port select input for each port. This enables for easy depth expansion. Both port selects are sampled on the rising edge of the positive input clock only (K). Each port select input can deselect the specified port ...

Page 10

... Delayed 50ohms Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 However not necessary to reset the PLL to lock to the desired frequency. The PLL automatically locks 20 s after a stable clock is presented. The PLL may be disabled by applying ground to the DOFF pin. When the PLL is turned off, the device behaves in QDR I mode (with one cycle latency and a longer access time) ...

Page 11

... Truth Table The truth table for CY7C1425KV18, CY7C1412KV18, and CY7C1414KV18 follow. Operation Write cycle: Load address on the rising edge of K; input write data on K and K rising edges. Read cycle: Load address on the rising edge of K; wait one and a half cycle; read data on C and C rising edges. ...

Page 12

... Is based on a write cycle that was initiated in accordance with the of a write cycle, as long as the setup and hold requirements are achieved. Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 [9, 10] Comments [9, 11] K – ...

Page 13

... TDI pin on the rising edge of TCK. Data is output on the TDO pin on the falling edge of TCK. Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Instruction Register Three-bit instructions are serially loaded into the instruction register. This register is loaded when it is placed between the TDI ...

Page 14

... Document Number: 001-57825 Rev. *F CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins ...

Page 15

... TAP Controller State Diagram The state diagram for the TAP controller follows. TEST-LOGIC 1 RESET 0 1 TEST-LOGIC/ 0 IDLE Note 12. The 0/1 next to each state represents the value at TMS at the rising edge of TCK. Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 [12] 1 SELECT DR-SCAN 0 1 CAPTURE- SHIFT- ...

Page 16

... These characteristics pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the 14. Overshoot: V < 0.85 V (Pulse width less than t IH(AC) DDQ 15. All voltage referenced to Ground. Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 0 Bypass Register Instruction Register ...

Page 17

... TDOX Notes 16. t and t refer to the setup and hold time requirements of latching data from the boundary scan register 17. Test conditions are specified using the load in TAP AC Test Conditions. t Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Description / ns CY7C1425KV18 Min Max ...

Page 18

... Test Clock TCK Test Mode Select TMS Test Data In TDI Test Data Out TDO Note 18. Test conditions are specified using the load in TAP AC Test Conditions. t Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 [18] Figure 3. TAP Timing and Test Conditions 0.9V 50 ...

Page 19

... TDO. Does not affect the SRAM operation. Do Not Use: This instruction is reserved for future use. Do Not Use: This instruction is reserved for future use. Places the bypass register between TDI and TDO. This operation does not affect SRAM operation. CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 Description CY7C1414KV18 000 Version number. 11010011010100111 Defines the type of SRAM ...

Page 20

... CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 Bump ID Bit # 100 ...

Page 21

... DDQ DOFF Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 PLL Constraints PLL uses K clock as its synchronizing input. The input must ■ have low phase jitter, which is specified as t The PLL functions at frequencies down to 120 MHz. ■ If the input clock is unstable and the PLL is enabled, then the ■ ...

Page 22

... Output are impedance controlled DDQ 23. Output are impedance controlled DDQ whichever is larger, V REF(min) DDQ Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Operating Range Range Commercial Industrial Neutron Soft Error Immunity Parameter DD + 0.5 V DDQ LSBU + 0 LMBU SEL * No LMBU or SEL events occurred during testing; this column represents a statistical  ...

Page 23

... I V operating supply Automatic power-down SB1 current Note 25. The operation current is calculated with 50% read cycle and 50% write cycle. Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Test Conditions V = Max mA, 333 MHz (× OUT 1/t MAX CYC (× 18) (× 36) 300 MHz (× ...

Page 24

... UNDER ZQ TEST RQ = 250  INCLUDING JIG AND (b) SCOPE  /2), Undershoot: V > 1.5 V (Pulse width less than t CYC IL(AC) /I and load capacitance shown in ( CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 Min Typ Max V + 0.2 – REF – – V REF Max = 1 1.5 V DDQ 165-ball FBGA Package 13.7 3.73 ALL INPUT PULSES 1 ...

Page 25

... When a part with a maximum frequency above 250 MHz is operating at a lower clock frequency, it requires the input timings of the frequency range in which it is operated and outputs data with the output timings of that frequency range. 31. This part has a voltage regulator internally; t POWER Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 333 MHz Min Max [31] 1 – ...

Page 26

... For frequencies 300 MHz or below, the Cypress QDR II devices surpass the QDR consortium specification for PLL lock time (tKC lock µs (min. spec.) and will lock after 1024 clock cycles (min. spec.), after a stable clock is presented, per the previous 90 nm version. Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 333 MHz Min Max – ...

Page 27

... Outputs are disabled (high Z) one clock cycle after a NOP. 38. In this example, if address A0 = A1, then data Q00 = D10 and Q01 = D11. Write data is forwarded immediately as read results. This note applies to the whole diagram. Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Figure 6. Read/Write/Deselect Sequence t CYC ...

Page 28

... Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office closest to you, visit us at http://www.cypress.com/go/datasheet/offices. Speed (MHz) Ordering Code 333 CY7C1425KV18-333BZC CY7C1412KV18-333BZC CY7C1414KV18-333BZC CY7C1414KV18-333BZXC CY7C1412KV18-333BZXI 300 CY7C1425KV18-300BZC CY7C1412KV18-300BZC CY7C1414KV18-300BZC CY7C1425KV18-300BZXC CY7C1412KV18-300BZXC CY7C1414KV18-300BZXC CY7C1414KV18-300BZI CY7C1412KV18-300BZXI ...

Page 29

... XXX 14XX K V18 Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 X Temperature Range Commercial = 0 C to +70  Industrial = –40 C to +85  Pb-free; X Absent = Leaded Package Type 165-ball FBGA Speed Grade: XXX = 333 MHz or 300 MHz or 250 MHz V18 = 1 ...

Page 30

... Package Diagram Figure 7. 165-ball FBGA (13 × 15 × 1.4 mm) BB165D/BW165D (0.5 Ball Diameter) Package Outline, 51-85180 Document Number: 001-57825 Rev. *F CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 51-85180 *E Page ...

Page 31

... TAP test access port TCK test clock TMS test mode select TDI test data-in TDO test data-out Document Number: 001-57825 Rev. *F CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 Document Conventions Units of Measure Symbol Unit of Measure °C degree Celsius MHz megahertz µA microampere µs microsecond ...

Page 32

... Document History Page Document Title: CY7C1425KV18/CY7C1412KV18/CY7C1414KV18, 36-Mbit QDR Document Number: 001-57825 Orig. of Rev. ECN No. Change ** 2816620 VKN / AESA *A 2884865 VKN *B 3018546 NJY *C 3155124 VIDB *D 3165654 NJY *E 3436284 PRIT *F 3549927 PRIT Document Number: 001-57825 Rev. *F CY7C1412KV18, CY7C1414KV18 Submission Date 11/27/2009 New data sheet. ...

Page 33

... QDR registered trademark of Cypress Semiconductor Corporation. QDR RAMs and Quad Data Rate RAMs comprise a new family of products developed by Cypress, IDT, NEC, Renesas, and Samsung. All products and company names mentioned in this document may be the trademarks of their respective holders. cypress.com/go/plc cypress.com/go/psoc cypress.com/go/touch cypress.com/go/USB Revised March 13, 2012 CY7C1425KV18 CY7C1412KV18, CY7C1414KV18 PSoC Solutions psoc.cypress.com/solutions PSoC 1 | PSoC 3 | PSoC 5 ...

Related keywords