CY7C199CN-15PXC Cypress Semiconductor Corp, CY7C199CN-15PXC Datasheet - Page 7

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CY7C199CN-15PXC

Manufacturer Part Number
CY7C199CN-15PXC
Description
IC SRAM 256KBIT 15NS 28DIP
Manufacturer
Cypress Semiconductor Corp
Type
Asynchronousr
Datasheets

Specifications of CY7C199CN-15PXC

Memory Size
256K (32K x 8)
Package / Case
28-DIP (0.300", 7.62mm)
Format - Memory
RAM
Memory Type
SRAM - Asynchronous
Speed
15ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
0°C ~ 70°C
Access Time
15 ns
Supply Voltage (max)
5.5 V
Supply Voltage (min)
4.5 V
Maximum Operating Current
80 mA
Organization
32 K x 8
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
- 40 C
Mounting Style
Through Hole
Number Of Ports
1
Operating Supply Voltage
5 V
Density
256Kb
Access Time (max)
15ns
Sync/async
Asynchronous
Architecture
Not Required
Clock Freq (max)
Not RequiredMHz
Operating Supply Voltage (typ)
5V
Address Bus
15b
Package Type
PDIP
Operating Temp Range
0C to 70C
Supply Current
80mA
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Operating Temperature Classification
Commercial
Mounting
Through Hole
Pin Count
28
Word Size
8b
Number Of Words
32K
Memory Configuration
32K X 8
Supply Voltage Range
4.5V To 5.5V
Memory Case Style
DIP
No. Of Pins
28
Operating Temperature Range
0°C To +70°C
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
428-2158-5
CY7C199CN-15PXC

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C199CN-15PXC
Manufacturer:
CYPRESSRESS
Quantity:
5 530
Part Number:
CY7C199CN-15PXC
Manufacturer:
CYPRESS/赛普拉斯
Quantity:
20 000
Notes
AC Electrical Characteristics
Data Retention Characteristics
Document #: 001-06435 Rev. *E
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
V
I
t
t
4. Test Conditions are based on a transition time of 3 ns or less and timing reference levels of 1.5 V, and input pulse levels of 0 to 3.0 V.
5. At any given temperature and voltage condition, t
6. t
7. The internal memory write time is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any of these
8. L-version only.
RC
AA
OHA
ACE
DOE
LZOE
HZOE
LZCE
HZCE
PU
PD
WC
SCE
AW
HA
SA
PWE
SD
HD
HZWE
LZWE
Parameter
CCDR
CDR
R
Parameter
DR
signals can terminate the write. The input data setup and hold timing must be referenced to the leading edge of the signal that terminates the write.
HZOE
, t
HZCE
, t
V
Data Retention Current
Chip Deselect to Data
Retention Time
Operation Recovery Time
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE to Data Valid
OE to Data Valid
OE to Low-Z
OE to High-Z
CE to Low-Z
CE to High-Z
CE to Power Up
CE to Power Down
Write Cycle Time
CE to Write End
Address Setup to Write End
Address Hold from Write End
Address Setup to Write Start
WE Pulse Width
Data Setup to Write End
Data Hold from Write End
WE LOW to High-Z
WE HIGH to Low-Z
HZWE
CC
for Data Retention
are specified as in part (b) of the
Description
[5]
[5]
[5, 6]
[5, 6]
Description
[7]
[5, 6]
[5]
V
V
HZCE
[4]
CC
IN
≥ V
[8]
“” on page
= V
is less than t
CC
DR
– 0.3 V or V
= 2.0 V, CE ≥ V
5. Transitions are measured ± 200 mV from steady state voltage.
LZCE
, t
Condition
HZOE
Min
15
15
10
10
3
0
3
0
0
0
9
9
0
3
IN
is less than t
≤ 0.3 V
–15
CC
Max
– 0.3 V,
15
15
15
7
7
7
7
LZOE
, and t
Min
20
20
15
15
15
10
3
0
3
0
0
0
0
3
HZWE
–20
is less than t
Max
20
20
20
10
9
9
9
Min
200
2.0
0
Unit
LZWE
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
for any given device.
Max
150
CY7C199CN
Page 7 of 18
Unit
μA
ns
μs
V
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