CY7C1370D-200BGXC Cypress Semiconductor Corp, CY7C1370D-200BGXC Datasheet

IC SRAM 18MBIT 200MHZ 119BGA

CY7C1370D-200BGXC

Manufacturer Part Number
CY7C1370D-200BGXC
Description
IC SRAM 18MBIT 200MHZ 119BGA
Manufacturer
Cypress Semiconductor Corp
Type
Synchronousr

Specifications of CY7C1370D-200BGXC

Memory Size
18M (512K x 36)
Package / Case
119-BGA
Format - Memory
RAM
Memory Type
SRAM - Synchronous
Speed
200MHz
Interface
Parallel
Voltage - Supply
3.135 V ~ 3.6 V
Operating Temperature
0°C ~ 70°C
Access Time
3 ns
Maximum Clock Frequency
200 MHz
Supply Voltage (max)
3.6 V
Supply Voltage (min)
3.135 V
Maximum Operating Current
300 mA
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Number Of Ports
4
Operating Supply Voltage
3.3 V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1370D-200BGXC
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
18-Mbit (512 K × 36/1 M × 18) Pipelined SRAM with NoBL™ Architecture
Features
Cypress Semiconductor Corporation
Document Number: 38-05558 Rev. *H
Logic Block Diagram - CY7C1370DV25 (512 K × 36)
Pin-compatible and functionally equivalent to ZBT™
Supports 250-MHz bus operations with zero wait states
Internally self-timed output buffer control to eliminate the need
to use asynchronous OE
Fully registered (inputs and outputs) for pipelined operation
Byte write capability
Single 2.5 V core power supply (V
2.5 V I/O power supply (V
Fast clock-to-output times
Clock enable (CEN) pin to suspend operation
Synchronous self-timed writes
Available in JEDEC-standard Pb-free 100-pin TQFP, Pb-free
and non Pb-free 119-ball BGA and 165-ball FBGA packages
IEEE 1149.1 JTAG-compatible boundary scan
Burst capability—linear or interleaved burst order
“ZZ” sleep mode option and stop clock option
Available speed grades are 250, 200 and 167 MHz
2.6 ns (for 250-MHz device)
CEN
CLK
A0, A1, A
ADV/LD
MODE
BW
BW
BW
BW
C
WE
CE1
CE2
CE3
OE
ZZ
DDQ
a
b
c
d
)
DD
)
WRITE ADDRESS
REGISTER 1
REGISTER 0
ADDRESS
CONTROL
READ LOGIC
SLEEP
Pipelined SRAM with NoBL™ Architecture
198 Champion Court
AND DATA COHERENCY
WRITE REGISTRY
CONTROL LOGIC
WRITE ADDRESS
ADV/LD
REGISTER 2
C
A1
A0
D1
D0
BURST
LOGIC
Q1
Q0
A1'
A0'
Functional Description
The CY7C1370DV25 and CY7C1372DV25 are 2.5 V, 512 K × 36
and 1-Mbit × 18 synchronous pipelined burst SRAMs with No
Bus Latency™ (NoBL logic, respectively. They are designed
to support unlimited true back-to-back read/write operations with
no wait states. The CY7C1370DV25 and CY7C1372DV25 are
equipped with the advanced NoBL logic required to enable
consecutive read/write operations with data being transferred on
every clock cycle. This feature dramatically improves the
throughput of data in systems that require frequent write/read
transitions. The CY7C1370DV25 and CY7C1372DV25 are
pin-compatible and functionally equivalent to ZBT devices.
All synchronous inputs pass through input registers controlled by
the rising edge of the clock. All data outputs pass through output
registers controlled by the rising edge of the clock. The clock
input is qualified by the clock enable (CEN) signal, which when
deasserted suspends operation and extends the previous clock
cycle.
Write operations are controlled by the byte write selects
(BW
CY7C1372DV25) and a write enable (WE) input. All writes are
conducted with on-chip synchronous self-timed write circuitry.
Three synchronous chip enables (CE
asynchronous output enable (OE) provide for easy bank
selection and output three-state control. In order to avoid bus
contention, the output drivers are synchronously three-stated
during the data portion of a write sequence.
18-Mbit (512 K × 36/1 M × 18)
DRIVERS
WRITE
a
–BW
d
REGISTER 1
MEMORY
ARRAY
San Jose
INPUT
for
E
M
N
A
S
E
S
E
P
S
CY7C1370DV25
,
CA 95134-1709
E
REGISTER 0
INPUT
D
A
T
A
S
T
E
E
R
N
G
I
E
O
U
T
P
U
T
B
U
F
F
E
R
S
E
CY7C1370DV25
CY7C1372DV25
Revised October 20, 2010
and
1
, CE
DQs
DQP
DQP
DQP
DQP
a
b
c
d
2
BW
, CE
408-943-2600
a
–BW
3
) and an
b
for
[+] Feedback

Related parts for CY7C1370D-200BGXC

CY7C1370D-200BGXC Summary of contents

Page 1

... K × 36/1 M × 18) Pipelined SRAM with NoBL™ Architecture Functional Description The CY7C1370DV25 and CY7C1372DV25 are 2.5 V, 512 K × 36 and 1-Mbit × 18 synchronous pipelined burst SRAMs with No Bus Latency™ (NoBL logic, respectively. They are designed to support unlimited true back-to-back read/write operations with no wait states ...

Page 2

... CE1 CE2 CE3 ZZ Document Number: 38-05558 Rev. *H ADDRESS REGISTER A0' BURST D0 Q0 LOGIC ADV/LD C WRITE ADDRESS WRITE ADDRESS REGISTER 1 REGISTER 2 WRITE REGISTRY MEMORY AND DATA COHERENCY WRITE ARRAY CONTROL LOGIC DRIVERS REGISTER 1 READ LOGIC Sleep Control CY7C1370DV25 CY7C1372DV25 DQs DQP T ...

Page 3

... TAP AC Switching Characteristics ............................... 14 2.5 V TAP AC Test Conditions ....................................... 15 2.5 V TAP AC Output Load Equivalent ......................... 15 TAP DC Electrical Characteristics and Operating Conditions ............................................. 15 Document Number: 38-05558 Rev. *H CY7C1370DV25 CY7C1372DV25 Scan Register Sizes ....................................................... 15 Identification Register Definitions ................................ 15 Identification Codes ....................................................... 16 119-ball BGA Boundary Scan Order ............................ 16 165-ball FBGA Boundary Scan Order .......................... 17 Maximum Ratings ...

Page 4

... DQa DQb DDQ 20 61 DDQ DQa DQb 22 59 DQa DQb 23 58 DQa DQPb 24 57 DQa DDQ 27 54 DDQ NC DQa 28 53 DQa DQPa CY7C1370DV25 CY7C1372DV25 167 MHz Unit 3.4 ns 275 DDQ DQPa 74 DQa 73 DQa DDQ DQa 69 DQa × 18 DQa 63 DQa DDQ ...

Page 5

... Pin Configurations (continued DDQ B NC/576M C NC/ DDQ DDQ DDQ NC/144M DDQ DDQ B NC/576M C NC/ DDQ DDQ DDQ NC/144M T NC/72M U V DDQ Document Number: 38-05558 Rev. *H 119-ball BGA Pinout CY7C1370DV25 (512 K × 36 ADV/ DQP CLK CEN DQP MODE NC/72M TMS TDI TCK ...

Page 6

... DDQ N DQP DDQ P NC/144M NC/72M A R MODE NC/36M NC/576M NC/1G A CE2 DDQ DDQ DDQ DDQ DDQ DDQ DDQ DDQ DDQ N DQP DDQ P NC/144M NC/72M A R MODE NC/36M A Document Number: 38-05558 Rev. *H 165-ball FBGA Pinout CY7C1370DV25 (512 K × 36 CEN CLK TDI A1 TDO ...

Page 7

... The direction of the pins is [17:0] –DQ are placed in a three-state condition. The outputs are controlled DQP is controlled controlled CY7C1370DV25 CY7C1372DV25 and DQP , BW controls DQ and DQP and DQP . d . During write s , DQP is controlled ...

Page 8

... Burst Read Accesses The CY7C1370DV25 and CY7C1372DV25 have an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four reads without reasserting the address inputs. ADV/LD must be driven LOW in order to load a new address into the SRAM, as described in the ) is 2 ...

Page 9

... CY7C1372DV25) are automatically three-stated during the data portion of a write cycle, regardless of the state of OE. Burst Write Accesses The CY7C1370DV25/CY7C1372DV25 has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four write operations without reasserting the address inputs ...

Page 10

... Next NOP/write abort (begin burst) None Write abort (continue burst) Next Ignore clock edge (stall) Current Sleep mode None Partial Write Cycle Description Function (CY7C1370DV25) Read Write – No bytes written Write byte a – (DQ and DQP ) a a Write byte b – (DQ and DQP ...

Page 11

... DQP ) b b Write both bytes IEEE 1149.1 Serial Boundary Scan (JTAG) The CY7C1370DV25/CY7C1372DV25 incorporates a serial boundary scan test access port (TAP).This part is fully compliant with 1149.1. The TAP operates using JEDEC-standard 3 2.5 V I/O logic levels. The CY7C1370DV25/CY7C1372DV25 controller, instruction register, boundary scan register, bypass register, and ID register ...

Page 12

... The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO balls when the TAP ) SS controller Shift-DR state. It also places all SRAM outputs into a high Z state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the CY7C1370DV25 CY7C1372DV25 Page [+] Feedback ...

Page 13

... TAP controller is in the “Test-Logic-Reset” state. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions CYC TL t TMSS t TMSH t TDIS t TDIH DON’T CARE UNDEFINED CY7C1370DV25 CY7C1372DV25 TDOV t TDOX Page [+] Feedback ...

Page 14

... Notes 9. t and t refer to the set-up and hold time requirements of latching data from the boundary scan register 10. Test conditions are specified using the load in TAP AC test Conditions. t Document Number: 38-05558 Rev. *H Description / ns CY7C1370DV25 CY7C1372DV25 Min Max Unit 50 – ns – 20 MHz 20 – ...

Page 15

... V OL DDQ V = 2.5 V DDQ V = 2.5 V DDQ GND < V < DDQ Bit Size (× 18 CY7C1372DV25 CY7C1370DV25 000 000 01011001000100101 01011001000010101 00000110100 00000110100 1 1 CY7C1370DV25 CY7C1372DV25 1.25V 50 50 20pF O Min Max Unit 2.0 – V 2.1 – V – 0.4 V – 0 –0.3 0.7 V – ...

Page 16

... Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. 119-ball BGA Boundary Scan Order Bit # Ball ID Bit # Notes 12. Balls which are NC (No Connect) are pre-set LOW. 13. Bit pre-set HIGH. Document Number: 38-05558 Rev. *H Description [12, 13] Ball ID Bit # Ball CY7C1370DV25 CY7C1372DV25 Bit # Ball Internal Page [+] Feedback ...

Page 17

... G11 25 F11 26 E11 27 D11 28 G10 29 F10 30 E10 Notes 14. Balls which are NC (No Connect) are pre-set LOW. 15. Bit pre-set HIGH. Document Number: 38-05558 Rev. *H [14, 15] Bit # Ball ID 31 D10 32 C11 33 A11 34 B11 35 A10 36 B10 C10 CY7C1370DV25 CY7C1372DV25 Bit # Ball Internal Page [+] Feedback ...

Page 18

... All speed grades DD  V  /2), undershoot: V (AC) > –2 V (Pulse width less than t CYC IL (min) within 200 ms. During this time V < V and CY7C1370DV25 CY7C1372DV25 + 0 Ambient DDQ Temperature 0 °C to +70 °C 2.5 V ± 5% –40 °C to +85 °C Min Max Unit 2.375 2.625 V 2.375 ...

Page 19

... Package Test conditions follow standard 28.66 test methods and procedures for measuring thermal 4.08 impedance, per EIA/JESD51 1667  2 DDQ GND 1538  INCLUDING JIG AND (b) SCOPE CY7C1370DV25 CY7C1372DV25 119 BGA 165 FBGA Unit Package Package 119 BGA 165 FBGA Unit ...

Page 20

... V minimum initially, before a read or write operation can be DD and t is less than t to eliminate bus contention between SRAMs when sharing the same EOLZ CHZ CLZ CY7C1370DV25 CY7C1372DV25 –200 –167 Unit Min Max Min Max 1 – ...

Page 21

... DOH CLZ D(A1) D(A2) D(A2+1) Q(A3) t BURST READ READ BURST WRITE Q(A3) Q(A4) READ D(A2+1) Q(A4+1) DON’T CARE UNDEFINED is LOW. When CE is HIGH HIGH CY7C1370DV25 CY7C1372DV25 OEV CHZ Q(A4) Q(A4+1) D(A5) Q(A6) OEHZ t DOH t OELZ WRITE READ WRITE DESELECT ...

Page 22

... A3 A4 D(A1) Q(A2) Q(A3) READ WRITE STALL Q(A3) D(A4) DON’T CARE High-Z DON’T CARE is LOW. When CE is HIGH HIGH CY7C1370DV25 CY7C1372DV25 CHZ D(A4) Q(A5) NOP READ DESELECT CONTINUE Q(A5) DESELECT UNDEFINED t ZZREC t RZZI DESELECT or READ Only is LOW HIGH ...

Page 23

... X = Pb-free; X Absent = Leaded Package Type 100-pin TQFP BZ = 165-ball FPBGA Speed Grade: XXX = 167 MHz / 200 MHz V25 = 2 Process Technology  90nm 137X 1370 = PL, 512 Kb × 36 (18 Mb) 1372 = PL × 18 (18 Mb) Marketing Code SRAMs Company ID Cypress CY7C1370DV25 CY7C1372DV25 Operating Range Commercial Commercial Page [+] Feedback ...

Page 24

... Package Diagrams Figure 1. 100-pin Thin Plastic Quad Flatpack (14 × 20 × 1.4 mm), 51-85050 Document Number: 38-05558 Rev. *H CY7C1370DV25 CY7C1372DV25 51-85050 *C Page [+] Feedback ...

Page 25

... Figure 2. 119-ball BGA (14 × 22 × 2.4 mm), 51-85115 Document Number: 38-05558 Rev. *H CY7C1370DV25 CY7C1372DV25 51-85115 *C Page [+] Feedback ...

Page 26

... Figure 3. 165-ball FPBGA (13 × 15 × 1.4 mm), 51-85180 Document Number: 38-05558 Rev. *H CY7C1370DV25 CY7C1372DV25 51-85180 *C Page [+] Feedback ...

Page 27

... TCK test clock TDI test data input TMS test mode select TDO test data output TQFP thin quad flat pack WE write enable Document Number: 38-05558 Rev. *H CY7C1370DV25 CY7C1372DV25 Document Conventions Units of Measure Symbol Unit of Measure ns nano seconds V Volts µA micro Amperes mA ...

Page 28

... Document History Page Document Title: CY7C1370DV25/CY7C1372DV25 18-Mbit (512 K × 36/1 M × 18) Pipelined SRAM with NoBL™ Architecture Document Number: 38-05558 Orig. of REV. ECN No. Issue Date Change ** 254509 See ECN *A 288531 See ECN *B 326078 See ECN *C 418125 See ECN *D 475677 See ECN ...

Page 29

... Document Number: 38-05558 Rev. *H NoBL and No Bus Latency are trademarks of Cypress Semiconductor Corporation. ZBT is a trademark of Integrated Device Technology, Inc. All products and company names mentioned in this document may be the trademarks of their respective holders. cypress.com/go/plc Revised October 20, 2010 CY7C1370DV25 CY7C1372DV25 PSoC Solutions psoc.cypress.com/solutions PSoC 1 ...

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