M27C1001-12F6 STMicroelectronics, M27C1001-12F6 Datasheet - Page 14

IC EPROM 1MBIT 120NS 32CDIP

M27C1001-12F6

Manufacturer Part Number
M27C1001-12F6
Description
IC EPROM 1MBIT 120NS 32CDIP
Manufacturer
STMicroelectronics
Datasheets

Specifications of M27C1001-12F6

Format - Memory
EPROMs
Memory Type
UV EPROM
Memory Size
1M (128K x 8)
Speed
120ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
32-CDIP (0.600", 15.24mm) Window
Capacitance, Input
6 pF
Capacitance, Output
12 pF
Current, Input, Leakage
±10 μA (Read)
Current, Operating
30 mA (Read)
Current, Output, Leakage
±10 μA (Read)
Current, Supply
30 mA
Density
1M
Organization
128K×8
Package Type
FDIP32W
Temperature, Operating
-40 to +85 °C
Temperature, Operating, Maximum
85 °C
Temperature, Operating, Minimum
-40 °C
Time, Access
120 ns
Time, Fall
≤20 ns
Time, Programmable
100 μs
Time, Rise
≤20 ns
Voltage, Input, High
6 V (Read)
Voltage, Input, High Level
2 V (Min.)
Voltage, Input, Low
0.8 V (Read)
Voltage, Input, Low Level
-0.3 V (Min.)
Voltage, Output, High
4.3 V (Read)
Voltage, Output, Low
0.4 V (Read)
Voltage, Programmable
11.5 V (Min.)
Voltage, Supply
5 V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-1632-5

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0
DC and AC characteristics
14/24
T
Table 7.
1. Sampled only, not 100% tested.
Table 8.
Figure 6.
Figure 7.
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
A
Symbol
C
= 25 °C, f = 1 MHz
C
OUT
IN
Input Capacitance
Output Capacitance
Capacitance
AC Measurement Conditions
AC Testing Input Output Waveform
AC Testing Load Circuit
Parameter
Parameter
High Speed
Standard
C L = 30pF for High Speed
C L = 100pF for Standard
C L includes JIG capacitance
2.4V
0.4V
DEVICE
(1)
UNDER
3V
0V
TEST
1.3V
Test Condition
1N914
3.3k
C L
High Speed
V
V
OUT
IN
0 to 3V
1.5V
10ns
= 0V
= 0V
OUT
AI01823B
1.5V
2.0V
0.8V
AI01822
Min
0.4V to 2.4V
0.8V and 2V
Standard
Max
12
6
20ns
M27C1001
Unit
pF
pF

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