AT93C56-10SI-1.8 Atmel, AT93C56-10SI-1.8 Datasheet - Page 2
![IC EEPROM 2KBIT 2MHZ 8SOIC](/photos/6/50/65032/453-8-soic_sml.jpg)
AT93C56-10SI-1.8
Manufacturer Part Number
AT93C56-10SI-1.8
Description
IC EEPROM 2KBIT 2MHZ 8SOIC
Manufacturer
Atmel
Datasheet
1.AT93C46-10PI-2.7.pdf
(21 pages)
Specifications of AT93C56-10SI-1.8
Format - Memory
EEPROMs - Serial
Memory Type
EEPROM
Memory Size
2K (256 x 8 or 128 x 16)
Speed
250kHz, 1MHz, 2MHz
Interface
3-Wire Serial
Voltage - Supply
1.8 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
8-SOIC (3.9mm Width)
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Absolute Maximum Ratings*
2
Operating Temperature......................................−55°C to +125°C
Storage Temperature .........................................−65°C to +150°C
Voltage on Any Pin
with Respect to Ground ........................................ −1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT93C46/56/66
Figure 1. Block Diagram
Note:
When the ORG pin is connected to VCC, the “x 16” organization is selected. When it is
connected to ground, the “x 8” organization is selected. If the ORG pin is left uncon-
nected and the application does not load the input beyond the capability of the internal 1
Meg ohm pullup, then the “x 16” organization is selected. The feature is not available on
the 1.8V devices.
For the AT93C46, if “x 16” organization is the mode of choice and Pin 6 (ORG) is left
unconnected, Atmel recommends using the AT93C46A device. For more details, see the
AT93C46A datasheet.
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only, and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
0172Y–SEEPR–11/04