AT25256AW-10SI-2.7 Atmel, AT25256AW-10SI-2.7 Datasheet - Page 2

• Manufacturer Part Number: AT25256AW-10SI-2.7
• Description: IC EEPROM 256KBIT 20MHZ 8SOIC
• Manufacturer: Atmel

Specifications of AT25256AW-10SI-2.7

• Format - Memory: EEPROMs - Serial
• Memory Type: EEPROM
• Memory Size: 256K (32K x 8)
• Speed: 10MHz, 20MHz
• Interface: SPI, 3-Wire Serial
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 8-SOIC (5.3mm Width), 8-SOP, 8-SOEIAJ
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: AT25256AW-10SI2.7

Table 0-1.
1. Absolute Maximum Ratings*
2
Pin Name
CS
SCK
SI
SO
GND
VCC
WP
HOLD
NC
Operating Temperature  55C to +125C
Storage Temperature 65C to +150C
Voltage on Any Pin
with Respect to Ground  1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT25128A_256A
Pin Configurations
Function
Chip Select
Serial Data Clock
Serial Data Input
Serial Data Output
Ground
Power Supply
Write Protect
Suspends Serial Input
No Connect
Block Write protection is enabled by programming the status register with top ¼, top ½ or entire
array of write protection. Separate Program Enable and Program Disable instructions are pro-
vided for additional data protection. Hardware data protection is provided via the WP pin to
protect against inadvertent write attempts to the status register. The HOLD pin may be used to
suspend any serial communication without resetting the serial sequence.
*NOTICE:
Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional
operation of the device at these or any other condi-
tions beyond those indicated in the operational sec-
tions of this specification is not implied. Exposure to
absolute maximum rating conditions for extended
periods may affect device reliability.
3368J–SEEPR–06/07