ADE7763ARS Analog Devices Inc, ADE7763ARS Datasheet - Page 6

• Manufacturer Part Number: ADE7763ARS
• Description: IC ENERGY METER 1PHASE 20SSOP
• Manufacturer: Analog Devices Inc

Specifications of ADE7763ARS

• Input Impedance: 390 KOhm
• Measurement Error: 0.1%
• Voltage - I/o High: 2.4V
• Voltage - I/o Low: 0.8V
• Current - Supply: 3mA
• Voltage - Supply: 4.75 V ~ 5.25 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 20-SSOP (0.200", 5.30mm Width)
• Meter Type: Single Phase
• For Use With: EVAL-ADE7763ZEB - BOARD EVALUATION FOR ADE7763
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

ADE7763
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
AVDD to AGND
DVDD to DGND
DVDD to AVDD
Analog Input Voltage to AGND
Reference Input Voltage to AGND
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
20-Lead SSOP, Power Dissipation
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
A
V1P, V1N, V2P, and V2N
Industrial
θ
Lead Temperature, Soldering
= 25°C, unless otherwise noted.
JA
Vapor Phase (60 s)
Infrared (15 s)
Thermal Impedance
Rating
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to +0.3 V
–6 V to +6 V
–0.3 V to AVDD + 0.3 V
–0.3 V to DVDD + 0.3 V
–0.3 V to DVDD + 0.3 V
–40°C to +85°C
–65°C to +150°C
150°C
450 mW
112°C/W
215°C
220°C
Rev. B | Page 6 of 56
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only, and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.