AD5520JST-REEL Analog Devices Inc, AD5520JST-REEL Datasheet - Page 21

IC SNGL PARAMETRIC MEASURE64LQFP

AD5520JST-REEL

Manufacturer Part Number
AD5520JST-REEL
Description
IC SNGL PARAMETRIC MEASURE64LQFP
Manufacturer
Analog Devices Inc
Type
Per-pin Parametric Measurement Unit (PPMU)r
Datasheet

Specifications of AD5520JST-REEL

Rohs Status
RoHS non-compliant
Applications
Automatic Test Equipment
Mounting Type
Surface Mount
Package / Case
64-LQFP
For Use With
EVAL-AD5520EBZ - BOARD EVAL FOR AD5520
TYPICAL APPLICATION CIRCUIT
Figure 27 shows the AD5520 as in an ATE system. This device
can used as a per pin parametric unit in order to speed up the
rate at which testing can be done. It can also be used as a DUT
power supply, as shown in the application circuit.
The central PMU shown in the block diagram (Figure 27) is
usually a highly accurate PMU and is shared among a number
of pins in the tester. In general, many discrete levels are required
in an ATE system for the pin drivers, comparators, clamps, and
active loads. DAC devices, such as the AD5379, offer a highly
integrated solution for a number of these levels. The AD5379 is
a dense 40-channel DAC designed with high channel
requirements, such as ATE.
COMPARE
MEMORY
GENERATOR
TIMING DATA
DLL, LOGIC
MEMORY
TIMING
FORMATTER
DE-SKEW
FORMATTER
DE-SKEW
CENTRAL PMU
DAC
ADC
DAC
DAC
DAC
DAC
DAC
DAC
DAC
DAC
COMP
VCOM
GUARD AMP
IOL
IOH
DRIVER
VTERM
VH
ACTIVE LOAD
VL
VTH
VTL
DAC
DAC
Figure 27. Typical Application ATE Circuit
VCL
VCH
Rev. B | Page 21 of 24
RELAYS
DAC
ADC
PPMU
The flexible function of the AD5520 also makes it suited for use
in instrumentation applications such as source measure units.
Source measure units are programmable instruments capable of
sourcing and measuring voltage or current simultaneously. The
AD5520 provides a more integrated solution in such
equipment.
GND SENSE
50Ω COAX
DEVICE POWER
SUPPLIES
DEVICE UNDER
DAC
ADC
TEST (DUT)
GUARD
AMP
AMP
AD5520

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