TLP624-2(F) Toshiba, TLP624-2(F) Datasheet - Page 61
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TLP624-2(F)
Manufacturer Part Number
TLP624-2(F)
Description
PHOTOCOUPLER DUAL TRANS OUT 8DIP
Manufacturer
Toshiba
Specifications of TLP624-2(F)
Number Of Channels
2
Input Type
DC
Voltage - Isolation
5000Vrms
Current Transfer Ratio (min)
100% @ 1mA
Current Transfer Ratio (max)
1200% @ 1mA
Voltage - Output
55V
Current - Output / Channel
50mA
Current - Dc Forward (if)
50mA
Vce Saturation (max)
400mV
Output Type
Transistor
Mounting Type
Through Hole
Package / Case
8-DIP (0.300", 7.62mm)
Configuration
2
Maximum Collector Emitter Voltage
55 V
Maximum Collector Emitter Saturation Voltage
200 mV (Typ)
Isolation Voltage
5000 Vrms
Current Transfer Ratio
1200 %
Maximum Forward Diode Voltage
1.3 V
Minimum Forward Diode Voltage
1 V
Maximum Collector Current
50 mA
Maximum Power Dissipation
150 mW
Maximum Operating Temperature
+ 75 C
Minimum Operating Temperature
- 25 C
Maximum Input Diode Current
50 mA
Maximum Reverse Diode Voltage
5 V
Output Device
Transistor
Number Of Elements
2
Reverse Breakdown Voltage
5V
Forward Voltage
1.3V
Forward Current
50mA
Collector-emitter Voltage
55V
Package Type
PDIP
Collector Current (dc) (max)
50mA
Power Dissipation
150mW
Collector-emitter Saturation Voltage
0.4V
Pin Count
8
Mounting
Through Hole
Operating Temp Range
-25C to 75C
Operating Temperature Classification
Commercial
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
TLP624-2F
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
2
2
10000000
1000000
100000
140
120
100
140
120
100
10000
GaA As (SH) LED Projected Operating Life Data
GaA As (SH) LED Projected Light Output Degradation Data
80
60
40
20
80
60
40
20
1000
0
0
100
1
1
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
X-3σ
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
1 / K (x10
X
X
–73
100000
100000
5.0
-3
)
61
10000000
1000000
100000
140
120
100
10000
80
60
40
20
1000
0
100
1
227
2.0
Failure criteria light output degradation Δ P O < –30%
I
I
I
I
I
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
1000
0
4.0
I
I
I
I
I
–30
F
F
F
F
F
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
1 / K (x10
X
–73
100000
5.0
-3
)