FOD250LS Fairchild Optoelectronics Group, FOD250LS Datasheet - Page 4

• Manufacturer Part Number: FOD250LS
• Description: OPTOCOUPLER TRANS 1CH 3.3V 8-SMD
• Manufacturer: Fairchild Optoelectronics Group

Specifications of FOD250LS

• Number Of Channels: 1
• Input Type: DC
• Voltage - Isolation: 5000Vrms
• Current Transfer Ratio (min): 15% @ 16mA
• Current Transfer Ratio (max): 50% @ 16mA
• Voltage - Output: 7V
• Current - Output / Channel: 8mA
• Current - Dc Forward (if): 25mA
• Output Type: Transistor with Vcc
• Mounting Type: Surface Mount
• Package / Case: 8-SMD
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Vce Saturation (max): -
• Other names: FOD250LSFS; FOD250LSFS; FOD250LS_NL; FOD250LS_NL

©2003 Fairchild Semiconductor Corporation
FOD050L, FOD250L, FOD053L Rev. 1.0.3
Electrical Characteristics
Switching Characteristics
Isolation Characteristics
*All Typicals at T
Notes:
2. The 1.9k load represents 1 TTL unit load of 1.6mA and 5.6k pull-up resistor.
3. The 4.1k load represents 1 LSTTL unit load of 0.36mA and 6.1k pull-up resistor.
4. Common mode transient immunity in logic high level is the maximum tolerable (positive) dV
5. Device is considered a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are
Symbol
Symbol
|CM
|CM
T
T
V
R
C
edge of the common mode pulse signal V
(i.e., V
dV
logic low state (i.e., V
shorted together.
I
PHL
PLH
I-O
ISO
I-O
I-O
H
cm
L
|
|
/dt on the trailing edge of the common mode pulse signal, V
O
Propagation Delay
Time to Logic LOW
Propagation Delay
Time to Logic HIGH
Common Mode
Transient Immunity
at Logic HIGH
Common Mode
Transient Immunity
at Logic LOW
Input-Output
Insulation Leakage
Current
Withstand Insulation
Test Voltage
Resistance
(input to output)
Capacitance
(input to output)
> 2.0V). Common mode transient immunity in logic low level is the maximum tolerable (negative)
Characteristics
Parameter
A
= 25°C
O
< 0.8V).
(V
CC
R
(Fig. 10)
R
(Fig. 10)
I
R
I
T
I
R
(Fig. 11)
I
R
F
F
F
F
A
L
L
L
L
L
= 0mA, V
= 0mA, V
= 16mA, V
= 16mA, V
Relative humidity = 45%,
T
V
f = 60Hz, T
t = 1 min.
V
f = 1MHz
= 3.3V)
= 25°C, R
(Continued) (T
= 1.9k , I
= 1.9k , I
= 4.1k , T
= 4.1k . T
= 1.9k
A
I-O
I-O
= 25°C, t = 5s,
= 3000VDC
= 500VDC
Test Conditions
Test Conditions
(2,4)
CM
(5)
CM
CM
(5)
L
CM
CM
F
F
A
A
A
, to assure that the output will remain in a logic high state
= 1.9k
= 16mA
= 16mA
= 1,000V
= 1,000V
= 25°C,
= 25°C
= 25°C
(Fig. 11)
= 1,000V
= 1,000 V
A
(5)
(5)
= 0 to 70°C unless otherwise specified.)
(3,4)
(2,4)
(3,4)
(2)
(2)
P-P
P-P
4
P-P
P-P
(Fig. 11)
(Fig. 11)
,
,
,
,
25°C
25°C
CM
FOD050L
FOD053L
FOD250L
Device
, to assure that the output will remain in a
Device
All
All
All
All
All
All
All
5,000
5,000
5,000
5,000
Min.
Min.
2500
5000
10
11
Typ.**
Typ.**
50,000
50,000
35,000
35,000
10
0.2
cm
12
/dt on the leading
Max.
1.0
Max. Unit
1.0
2.0
1.0
2.0
www.fairchildsemi.com
V
V/µs
V/µs
V/µs
V/µs
Unit
µs
µs
µA
pF
RMS