KIT33984PNAEVB Freescale Semiconductor, KIT33984PNAEVB Datasheet - Page 35

KIT PRELIM EVALUATION MC3398PNA

KIT33984PNAEVB

Manufacturer Part Number
KIT33984PNAEVB
Description
KIT PRELIM EVALUATION MC3398PNA
Manufacturer
Freescale Semiconductor
Type
Other Power Managementr
Datasheet

Specifications of KIT33984PNAEVB

Main Purpose
Power Management, High Side Driver (Internal FET)
Embedded
No
Utilized Ic / Part
MC33984
Primary Attributes
Output current monitoring, 2 SPI-selectable current ratios
Secondary Attributes
SPI control of over-current limit, open load detection, output ON/OFF, slew rates
Input Voltage
6 V to 27 V
Interface Type
SPI
Product
Power Management Modules
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With/related Products
MC33984
Device on Thermal Test Board
Analog Integrated Circuit Device Data
Freescale Semiconductor
Material:
Outline:
Area A:
Ambient Conditions:
12
11 10 9 8
12.0 mm x 12.0 mm Body
33984 Pin Connections
HS1
15
16-Pin PQFN
Transparent Top View
0.90 mm Pitch
VPWR
Single layer printed circuit board
FR4, 1.6 mm thickness
Cu traces, 0.07 mm thickness
80 mm x 100 mm board area,
including edge connector for
thermal testing
Cu heat-spreading areas on board
surface
Natural convection, still air
GND
7
14
13
6 5
A
HS0
4
16
A
3 2
1
Figure 2. Thermal Test Board
Table 2. Thermal Resistance Performance
ambient air.
die that is heated. Index n refers to the number of the die
where the junction temperature is sensed.
Resistance
R
Thermal
R
This device is a dual die package. Index m indicates the
θJAmn
θJA
A
is the thermal resistance between die junction and
Area A
(mm
300
600
0
2
)
1 = Power Chip, 2 = Logic Chip (°C/W)
m = 1,
n = 1
55
41
38
THERMAL ADDENDUM (REV 2.0)
ADDITIONAL DOCUMENTATION
m = 1, n = 2
m = 2, n = 1
42
31
29
m = 2,
n = 2
74
66
64
33984
35

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