EVAL-AD7476ACB Analog Devices Inc, EVAL-AD7476ACB Datasheet - Page 10
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EVAL-AD7476ACB
Manufacturer Part Number
EVAL-AD7476ACB
Description
BOARD EVAL FOR AD7476A
Manufacturer
Analog Devices Inc
Datasheet
1.EVAL-AD7476ACB.pdf
(28 pages)
Specifications of EVAL-AD7476ACB
Rohs Status
RoHS non-compliant
Number Of Adc's
1
Number Of Bits
12
Sampling Rate (per Second)
1M
Data Interface
Serial
Inputs Per Adc
1 Differential
Input Range
0 ~ 5.25 V
Power (typ) @ Conditions
17.5mW @ 1MSPS, 5 V
Voltage Supply Source
Single
Operating Temperature
-40°C ~ 85°C
Utilized Ic / Part
AD7476A
Lead Free Status / Rohs Status
Not Compliant
AD7476A/AD7477A/AD7478A
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
V
Analog Input Voltage to GND
Digital Input Voltage to GND
Digital Output Voltage to GND
Input Current to Any Pin Except Supplies
Operating Temperature Range
Junction Temperature
MSOP Package
SC70 Package
Lead Temperature, Soldering
Pb-Free Temperature Soldering
ESD
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Transient currents of up to 100 mA do not cause SCR latch-up.
DD
A
Commercial (A and B Grades)
Industrial (Y Grade)
Storage Temperature Range
θ
θ
θ
θ
Reflow (10 sec to 30 sec)
Reflow
= 25°C, unless otherwise noted.
to GND
JA
JC
JA
JC
Thermal Impedance
Thermal Impedance
Thermal Impedance
Thermal Impedance
1
Ratings
–0.3 V to +7 V
–0.3 V to V
–0.3 V to +7 V
–0.3 V to V
10 mA
–40°C to +85°C
–40°C to +125°C
–65°C to +150°C
150°C
205.9°C/W
43.74°C/W
340.2°C/W
228.9°C/W
235 (0/+5)°C
255 (0/+5)°C
3.5 kV
DD
DD
+ 0.3 V
+ 0.3 V
Rev. E | Page 10 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.