ADC12062EVAL National Semiconductor, ADC12062EVAL Datasheet - Page 4

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ADC12062EVAL

Manufacturer Part Number
ADC12062EVAL
Description
BOARD EVALUATION FOR ADC12062
Manufacturer
National Semiconductor
Datasheets

Specifications of ADC12062EVAL

Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
*ADC12062EVAL
www.national.com
t
t
t
t
t
t
t
t
t
t
t
EOC
ACC
1H
INTH
INTL
UPDATE
MS
MH
CSS
CSH
WU
AC Electrical Characteristics
Symbol
The following specifications apply for DV
unless otherwise specified. Boldface limits apply for T
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional. These ratings do not guarantee specific performance limits, however. For guaranteed specifications and test conditions, see the Electrical Characteristics.
The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the
listed test conditions.
Note 2: All voltages are measured with respect to GND (GND = AGND = DGND), unless otherwise specified.
Note 3: When the input voltage (V
to 25 mA or less. The 50 mA package input current limits the number of pins that can safely exceed the power supplies with an input current of 25 mA to two.
Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
allowable power dissipation at any temperature is P
(PLCC) package is 55˚C/W.
conditions.
Note 5: Human body model, 100 pF discharged through a 1.5 k
Note 6: See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices.
Note 7: Typicals are at +25˚C and represent most likely parametric norm.
Note 8: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 9: Integral Linearity Error is the maximum deviation from a straight line between the measured offset and full scale endpoints.
Note 10: Dynamic testing of the ADC12062 is done using the ADC IN input. The input multiplexer adds harmonic distortion at high frequencies. See the graph in
the Typical Performance Characteristics section for a typical graph of THD performance vs input frequency with and without the input multiplexer.
Note 11: The signal-to-noise ratio is the ratio of the signal amplitude to the background noise level. Harmonics of the input signal are not included in its calculation.
Note 12: The contributions from the first nine harmonics are used in the calculation of the THD.
Note 13: Effective Number of Bits (ENOB) is calculated from the measured signal-to-noise plus distortion ratio (SINAD) using the equation ENOB = (SINAD −
1.76)/6.02.
Note 14: The digital power supply current takes up to 10 seconds to decay to its final value after PD is pulled low. This prohibits production testing of the standby
current. Some parts may exhibit significantly higher standby currents than the 20 µA typical.
Note 15: Power Supply Sensitivity is defined as the change in the Offset Error or the Full Scale Error due to a change in the supply voltage.
, t
0H
S/H Low to EOC Low
Access Time
(RD Low or OE High to Data Valid)
TRI-STATE Control
(RD High or OE Low to Databus TRI-STATE)
Delay from RD Low to INT High
Delay from EOC High to INT Low
EOC High to New Data Valid
Multiplexer Address Setup Time
(MUX Address Valid to EOC Low)
Multiplexer Address Hold Time
(EOC Low to MUX Address Invalid)
CS Setup Time
(CS Low to RD Low, S/H Low, or OE High)
CS Hold Time
(CS High after RD High, S/H High, or OE Low)
Wake-Up Time
(PD High to First S/H Low)
JA
for the VF (PQFP) package is 62˚C/W. In most cases the maximum derated power dissipation will be reached only during fault
IN
) at any pin exceeds the power supply rails (V
Parameter
D
CC
= (T
= AV
JMAX
CC
− T
(Continued)
A
= +5V, V
resistor. Machine model ESD rating is 200V.
)/
JA
A
or the number given in the Absolute Maximum Ratings, whichever is lower.
= T
J
REF+(SENSE)
4
from T
IN
C
R
C
C
<
L
L
L
L
GND or V
= 100 pF
= 1k, C
= 100 pF
= 100 pF
MIN
Conditions
= +4.096V, V
to T
IN
L
>
= 10 pF
V
MAX
CC
JMAX
) the absolute value of current at that pin should be limited
; all other limits T
,
JA
REF−(SENSE)
and the ambient temperature T
(Note 7)
Typ
−25
95
10
25
35
5
1
= AGND, and f
A
= T
(Note 8)
Limit
J
185
−35
60
20
40
60
−5
30
50
50
20
20
= +25˚C.
A
. The maximum
s
= 1 MHz,
ns (max)
ns (max)
ns (max)
ns (max)
ns (max)
ns (max)
ns (min)
ns (min)
ns (min)
ns (min)
ns (min)
ns (min)
JA
(Limits)
Units
for the V
µs

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