EVAL-ADM1026EB ON Semiconductor, EVAL-ADM1026EB Datasheet - Page 7

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EVAL-ADM1026EB

Manufacturer Part Number
EVAL-ADM1026EB
Description
BOARD EVAL FOR ADM1026
Manufacturer
ON Semiconductor
Type
Temperature Sensorr
Datasheet

Specifications of EVAL-ADM1026EB

Contents
Evaluation Board
For Use With/related Products
ADM1026
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
1. All voltages are measured with respect to GND, unless otherwise specified.
2. Typicals are at T
3. Timing specifications are tested at logic levels of V
4. Total unadjusted error (TUE) includes offset, gain, and linearity errors of the ADC, multiplexer, and on−chip input attenuators. V
5. Total analog monitoring cycle time is nominally 273 ms, made up of 18 ms × 11.38 ms measurements on analog input and internal temperature
6. The total fan count is based on two pulses per revolution of the fan tachometer output. The total fan monitoring time depends on the number
7. ADD is a three−state input that may be pulled high, low, or left open circuit.
8. Logic inputs accept input high voltages up to 5.0 V even when device is operating at supply voltages below 5.0 V.
9. Endurance is qualified to 100,000 cycles as per JEDEC Std. 22 method A117, and measured at −40°C, +25°C, and +85°C. Typical endurance
10. Retention lifetime equivalent at junction temperature (T
ELECTRICAL CHARACTERISTICS
SERIAL BUS TIMING
Start Hold Time, t
SCL Low Time, t
SCL High Time, t
SCL, SDA Rise Time, t
SCL, SDA Fall Time, t
Data Setup Time, t
Data Hold Time, t
only for V
channels, and 2 ms × 34.13 ms measurements on external temperature channels.
of fans connected and the fan speed. See the Fan Speed Measurement section for more details.
at +25°C is 700,000 cycles.
energy of 0.6 V derates with junction temperature as shown in Figure 15.
SDA
SCL
BAT
P
voltages greater than 1.5 V (see Figure 14).
t
LOW
BUF
HIGH
HD; STA
HD; DAT
A
SU; DAT
Parameter
= 25°C and represent the most likely parametric norm. Shutdown current typ is measured with V
S
f
r
t
t
HD; STA
LOW
t
HD; DAT
t
R
T
A
= T
Figure 2. Serial Bus Timing Diagram
MIN
to T
IL
t
HIGH
= 0.8 V for a falling edge and V
J
MAX
) = 55°C as per JEDEC Std. 22 method A117. Retention lifetime based on activation
http://onsemi.com
t
Test Conditions/Comments
F
, V
CC
= V
7
t
SU; DAT
MIN
to V
MAX
S
, unless otherwise noted. (Note 1, 2, and 3)
t
IH
SU; STA
= 2.1 V for a rising edge.
t
HD; STA
Min
250
300
4.0
4.7
4.0
Typ
t
SU; STO
CC
1000
Max
300
= 3.3V.
BAT
P
is accurate
Unit
ms
ms
ms
ns
ns
ns
ns

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