SW500007 Microchip Technology, SW500007 Datasheet - Page 261
SW500007
Manufacturer Part Number
SW500007
Description
PICC-18 PRO
Manufacturer
Microchip Technology
Type
Compilerr
Series
PIC18r
Specifications of SW500007
Supported Families
PIC18
Core Architecture
PIC
Software Edition
Professional
Kit Contents
Software And Docs
Mcu Supported Families
PIC18
Tool Function
Compiler
Tool Type
Compiler
Lead Free Status / RoHS Status
Not applicable / RoHS Compliant
For Use With/related Products
PIC18 Series
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
015P
778-1002
778-1002
778-1002
778-1002
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Library Functions
RAM_TEST_FAILED
Synopsis
void ram_test_failed (unsigned char errcode)
Description
The ram_test_failed() function is not intended to be called from within the general execution of
the program. This routine is called during execution of the generated runtime startup code if the
program is using a compiler generated RAM integrity test and the integrity test detects a bad cell.
This function is passed a single byte error code as a parameter. The address that failed this test
will be loaded in the FSR0 registers. The failed value will still be accessable through the INDF0
register. The default operation of this routine will halt program execution if a bad cell is detected,
however the user is free to enhance this functionality if required.
See Also
__ram_cell_test
Note
This routine is intended to be replaced by an equivalent routine to suit the user’s implementation.
Possible enhancements include logging the location of the dead cell and continuing to test if there
are any more more dead cells, or alerting the outside world that the device has a memory problem.
247
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