MAX3208EAUB+ Maxim Integrated Products, MAX3208EAUB+ Datasheet - Page 7

IC ESD PROT DIFF 10-UMAX

MAX3208EAUB+

Manufacturer Part Number
MAX3208EAUB+
Description
IC ESD PROT DIFF 10-UMAX
Manufacturer
Maxim Integrated Products
Type
Diode Arraysr
Series
MAX3208Er
Datasheet

Specifications of MAX3208EAUB+

Power (watts)
444mW
Polarization
4 Channel Array - Unidirectional
Mounting Type
Surface Mount
Package / Case
10-MSOP, Micro10™, 10-uMAX, 10-uSOP
Capacitance Value
10(Typ) pF
Maximum Clamping Voltage
105.5 V
Number Of Elements Per Chip
4
Esd Protection Voltage
±15@HBM|±15@Air Gap|±8@Contact Disc KV
Maximum Leakage Current
0.1 uA
Channels
4 Channels
Clamping Voltage
100 V
Operating Voltage
- 0.3 V to + 6.0 V
Termination Style
SMD/SMT
Capacitance
2 pF
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 40 C
Dimensions
3.05 (Max) mm W x 3.05 (Max) mm L
Diode Type
ESD Protection
Power Dissipation Pd
444mW
Diode Case Style
µMAX
No. Of Pins
10
Termination Type
SMD
Capacitance, Cd
2.6pF
Operating Temperature Range
-40°C To +125°C
Rohs Compliant
Yes
Filter Terminals
SMD
Esd Threat Voltage Max
15kV
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Voltage - Breakdown
-
Voltage - Reverse Standoff (typ)
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Proper circuit-board layout is critical to suppress ESD-
induced line transients (See Figure 6). The MAX3205E/
MAX3207E/MAX3208E clamp to 100V; however, with
improper layout, the voltage spike at the device can be
much higher. A lead inductance of 10nH with a 45A
current spike results in an additional 450V spike on the
protected line. It is essential that the layout of the PC
board follows these guidelines:
1) Minimize trace length between the connector or
2) Use separate planes for power and ground to reduce
3) Ensure short low-inductance ESD transient return
4) Minimize conductive power and ground loops.
5) Do not place critical signals near the edge of the PC
Figure 6. Layout Considerations
input terminal, I/O_, and the protected signal line.
parasitic inductance and to reduce the impedance to
the power rails for shunted ESD current.
paths to GND and V
board.
NEGATIVE ESD-
CURRENT
PULSE
PATH TO
GROUND
GND
V
PROTECTED LINE
CC
L1
_______________________________________________________________________________________
D1
D2
Layout Recommendations
CC
I/O_
.
L2
L3
Dual, Quad, and Hex High-Speed
V
C
Differential ESD-Protection ICs
PROTECTED
CIRCUIT
6) Bypass V
7) Bypass the supply of the protected device to GND
For the latest application details on WLP construction,
dimensions, tape carrier information, printed circuit
board techniques, bump-pad layout, and recommend-
ed reflow temperature profile, as well as the latest infor-
mation on reliability testing results, refer to Application
Note 1891: Wafer-Level Packaging (WLP) and Its
Applications .
PROCESS: BiCMOS
0.1μF
tor as close to V
with a low-ESR ceramic capacitor as close to the
supply pin as possible.
V
CC
WLP Applications Information
I/0 LINE
CC
Typical Operating Circuit
I/0_
MAX3205E
MAX3207E
MAX3208E
to GND with a low-ESR ceramic capaci-
CC
as possible.
Chip Information
0.1μF
V
CC
I/0
PROTECTED
CIRCUIT
7

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