AD8000YCPZ-R2 Analog Devices Inc, AD8000YCPZ-R2 Datasheet - Page 5

IC OPAMP CF LN 100MA 8SFCSP

AD8000YCPZ-R2

Manufacturer Part Number
AD8000YCPZ-R2
Description
IC OPAMP CF LN 100MA 8SFCSP
Manufacturer
Analog Devices Inc
Datasheets

Specifications of AD8000YCPZ-R2

Slew Rate
4100 V/µs
Amplifier Type
Current Feedback
Number Of Circuits
1
-3db Bandwidth
1.35GHz
Current - Input Bias
5µA
Voltage - Input Offset
1000µV
Current - Supply
13.5mA
Current - Output / Channel
100mA
Voltage - Supply, Single/dual (±)
4.5 V ~ 12 V, ±2.25 V ~ 6 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
8-LFCSP
Op Amp Type
High Speed
No. Of Amplifiers
1
Bandwidth
1.5MHz
Supply Voltage Range
4.5V To 12V
Amplifier Case Style
LFCSP
No. Of Pins
8
Operating Temperature Range
-40°C To
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Output Type
-
Gain Bandwidth Product
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
AD8000YCPZ-R2TR
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
Supply Voltage
Power Dissipation
Common-Mode Input Voltage
Differential Input Voltage
Storage Temperature
Operating Temperature Range
Lead Temperature Range
Junction Temperature
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θ
fied for device soldered in the circuit board for surface-mount
packages.
Table 4. Thermal Resistance
Package Type
SOIC-8
3 mm × 3 mm LFCSP
Maximum Power Dissipation
The maximum safe power dissipation for the AD8000 is limited
by the associated rise in junction temperature (T
approximately 150°C, which is the glass transition temperature,
the properties of the plastic change. Even temporarily exceeding
this temperature limit can change the stresses that the package
exerts on the die, permanently shifting the parametric perfor-
mance of the AD8000. Exceeding a junction temperature of
175°C for an extended period of time can result in changes
in silicon devices, potentially causing degradation or loss of
functionality.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate
on the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy elec-
trostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation
and loss of functionality.
JA
(Soldering, 10 sec)
is specified for the worst-case conditions, that is, θ
θ
80
93
JA
Rating
12.6 V
See Figure 4
−V
±V
−65°C to +125°C
−40°C to +125°C
300°C
150°C
S
S
− 0.7 V to +V
θ
30
35
JC
J
) on the die. At
S
JA
Unit
°C/W
°C/W
+ 0.7 V
is speci-
Rev. A | Page 5 of 20
The power dissipated in the package (P
quiescent power dissipation and the power dissipated in the die
due to the AD8000 drive at the output. The quiescent power is
the voltage between the supply pins (V
current (I
RMS output voltages should be considered. If R
to −V
V
the worst case, when V
In single-supply operation with R
is V
Airflow increases heat dissipation, effectively reducing θ
Also, more metal directly in contact with the package leads and
exposed paddle from metal traces, through holes, ground, and
power planes reduces θ
Figure 4 shows the maximum safe power dissipation in the
package vs. the ambient temperature for the exposed paddle
SOIC (80°C/W) and the LFCSP (93°C/W) package on a JEDEC
standard 4-layer board. θ
Figure 4. Maximum Power Dissipation vs. Temperature for a 4-Layer Board
S
× I
OUT
P
P
P
S
OUT
D
D
, as in single-supply operation, the total drive power is
D
3.0
2.5
2.0
1.5
1.0
0.5
= V
= Quiescent Power + (Total Drive Power – Load Power)
=
=
0
. If the rms signal levels are indeterminate, consider
S
–40
).
(
(
V
V
S
/2.
–30 –20 –10 0
S
S
×
×
I
I
S
S
)
)
+
+
(
V
V
OUT
AMBIENT TEMPERATURE (°C)
JA
S
2
R
10
S
/
.
JA
L
4
LFCSP
×
= V
)
values are approximations.
20
2
V
R
SOIC
OUT
30
S
L
/4 for R
40
L
referenced to −V
50
V
OUT
R
S
L
60
D
) times the quiescent
to midsupply.
) is the sum of the
L
70
2
80
L
90
is referenced
100
S
AD8000
, worst case
110
120
JA
.

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