ATMEGA1281R231-AU Atmel, ATMEGA1281R231-AU Datasheet - Page 30

• Manufacturer Part Number: ATMEGA1281R231-AU
• Description: BUNDLE ATMEGA1281V/RF231 TQFP
• Manufacturer: Atmel

Specifications of ATMEGA1281R231-AU

• Frequency: 2.4GHz
• Modulation Or Protocol: 802.15.4 Zigbee, 6LoWPAN, RF4CE, SP100, WirelessHART™, ISM
• Data Interface: PCB, Surface Mount
• Memory Size: 128kB Flash, 4kB EEPROM, 8kB RAM
• Antenna Connector: PCB, Surface Mount
• Package / Case: 64-TQFP, 32-QFN
• Processor Series: ATMEGA128x
• Core: AVR8
• Data Bus Width: 8 bit
• Program Memory Type: Flash
• Program Memory Size: 128 KB
• Data Ram Size: 8 KB
• Development Tools By Supplier: ATAVRRZ541, ATAVRRAVEN, ATAVRRZRAVEN, ATAVRRZUSBSTICK, ATAVRISP2, ATAVRRZ201
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Voltage - Supply: -
• Power - Output: -
• Operating Temperature: -
• Applications: -
• Sensitivity: -
• Data Rate - Maximum: -
• Current - Transmitting: -
• Current - Receiving: -
• Lead Free Status / Rohs Status: Details

10.4
10.5
10.6
10.7
10.8
2549MS–AVR–09/10
ATmega2560 rev. E
ATmega2560 rev. D
ATmega2560 rev. C
ATmega2560 rev. B
ATmega2560 rev. A
2. High current consumption in sleep mode
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1. High current consumption in sleep mode
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1.
2. Part does not work under 2.4 volts
High current consumption in sleep mode.
Non-Read-While-Write area of flash not functional.
Part does not work under 2.4 volts.
Incorrect ADC reading in differential mode.
Internal ADC reference has too low value.
IN/OUT instructions may be executed twice when Stack is in external RAM.
EEPROM read from application code does not work in Lock Bit Mode 3.
If a pending interrupt cannot wake the part up from the selected sleep mode, the current
consumption will increase during sleep when executing the SLEEP instruction directly after
a SEI instruction.
Problem Fix/Workaround
Before entering sleep, interrupts not used to wake the part from the sleep mode should be
disabled.
No known errata.
Not sampled.
If a pending interrupt cannot wake the part up from the selected sleep mode, the current
consumption will increase during sleep when executing the SLEEP instruction directly after
a SEI instruction.
Problem Fix/Workaround
Before entering sleep, interrupts not used to wake the part from the sleep mode should be
disabled.
Not sampled.
The Non-Read-While-Write area of the flash is not working as expected. The problem is
related to the speed of the part when reading the flash of this area.
Problem Fix/Workaround
- Only use the first 248K of the flash.
- If boot functionality is needed, run the code in the Non-Read-While-Write area at maximum
1/4th of the maximum frequency of the device at any given voltage. This is done by writing
the CLKPR register before entering the boot section of the code.
The part does not execute code correctly below 2.4 volts.
Non-Read-While-Write area of flash not functional
ATmega640/1280/1281/2560/2561
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