BZX384-C12,115 NXP Semiconductors, BZX384-C12,115 Datasheet - Page 5

• Manufacturer Part Number: BZX384-C12,115
• Description: DIODE ZENER 12V 300MW SOD323
• Manufacturer: NXP Semiconductors

Specifications of BZX384-C12,115

• Package / Case: SC-76, SOD-323, UMD2
• Mounting Type: Surface Mount
• Power - Max: 300mW
• Tolerance: ±5%
• Current - Reverse Leakage @ Vr: 100nA @ 8V
• Voltage - Forward (vf) (max) @ If: 1.1V @ 100mA
• Voltage - Zener (nom) (vz): 12V
• Impedance (max) (zzt): 25 Ohm
• Zener Voltage: 12.05 V
• Voltage Tolerance: 5 %
• Voltage Temperature Coefficient: 8.4 mV / K
• Zener Current: 200 mA
• Power Dissipation: 300 mW
• Maximum Reverse Leakage Current: 100 nA
• Maximum Zener Impedance: 25 Ohms
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 65 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 934057642115::BZX384-C12 T/R::BZX384-C12 T/R

Table 1 Per type BZX384-B/C2V4 to B/C24
T
2V4
2V7
3V0
3V3
3V6
3V9
4V3
4V7
5V1
5V6
6V2
6V8
7V5
8V2
9V1
10
11
12
13
15
16
18
20
22
24
j
BZX-
Bxxx
Cxxx
= 25 °C unless otherwise specified.
2.35
2.65
2.94
3.23
3.53
3.82
4.21
4.61
5.00
5.49
6.08
6.66
7.35
8.04
8.92
9.80
10.80
11.80
12.70
14.70
15.70
17.60
19.60
21.60
23.50
MIN.
Tol. ±2% (B)
WORKING VOLTAGE V
at I
2.45
2.75
3.06
3.37
3.67
3.98
4.39
4.79
5.20
5.71
6.32
6.94
7.65
8.36
9.28
10.20
11.20
12.20
13.30
15.30
16.30
18.40
20.40
22.40
24.50
MAX.
Ztest
= 5 mA
2.2
2.5
2.8
3.1
3.4
3.7
4.0
4.4
4.8
5.2
5.8
6.4
7.0
7.7
8.5
9.4
10.4
11.4
12.4
13.8
15.3
16.8
18.8
20.8
22.8
MIN.
Tol. ±5% (C)
2.6
2.9
3.2
3.5
3.8
4.1
4.6
5.0
5.4
6.0
6.6
7.2
7.9
8.7
9.6
10.6
11.6
12.7
14.1
15.6
17.1
19.1
21.2
23.3
25.6
Z
MAX.
(V)
275
300
325
350
375
400
410
425
400
80
40
30
30
40
40
50
50
50
50
50
50
50
60
60
60
at I
TYP.
DIFFERENTIAL RESISTANCE
Ztest
= 1 mA
600
600
600
600
600
600
600
500
480
400
150
80
80
80
100
150
150
150
170
200
200
225
225
250
250
MAX.
r
dif
(Ω)
70
75
80
85
85
85
80
50
40
15
6
6
6
6
6
8
10
10
10
10
10
10
15
20
25
at I
TYP.
Ztest
= 5 mA
100
100
95
95
90
90
90
80
60
40
10
15
15
15
15
20
20
25
30
30
40
45
55
55
70
MAX.
−3.5
−3.5
−3.5
−3.5
−3.5
−3.5
−3.5
−3.5
−2.7
−2.0
0.4
1.2
2.5
3.2
3.8
4.5
5.4
6.0
7.0
9.2
10.4
12.4
14.4
16.4
18.4
COEFFICIENT S
MIN.
(see Figs 4 and 5)
TEMPERATURE
at I
Ztest
−1.6
−2.0
−2.1
−2.4
−2.4
−2.5
−2.5
−1.4
−0.8
1.2
2.3
3.0
4.0
4.6
5.5
6.4
7.4
8.4
9.4
11.4
12.4
14.4
16.4
18.4
20.4
TYP.
= 5 mA
Z
(mV/K)
0
0
0
0
0
0
0
0.2
1.2
2.5
3.7
4.5
5.3
6.2
7.0
8.0
9.0
10.0
11.0
13.0
14.0
16.0
18.0
20.0
22.0
MAX.
450
450
450
450
450
450
450
300
300
300
200
200
150
150
150
90
85
85
80
75
75
70
60
60
55
DIODE CAP.
at f = 1 MHz;
V
C
R
MAX.
d
= 0 V
(pF)
6.0
6.0
6.0
6.0
6.0
6.0
6.0
6.0
6.0
6.0
6.0
6.0
4.0
4.0
3.0
3.0
2.5
2.5
2.5
2.0
1.5
1.5
1.5
1.25
1.25
CURRENT I
NON-REPETITIVE
PEAK REVERSE
at t
T
amb
p
MAX.
= 100 μs;
= 25 °C
ZSM
(A)