AD5253BRU100 Analog Devices Inc, AD5253BRU100 Datasheet - Page 8

IC,Digital Potentiometer,TSSOP,20PIN,PLASTIC

AD5253BRU100

Manufacturer Part Number
AD5253BRU100
Description
IC,Digital Potentiometer,TSSOP,20PIN,PLASTIC
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5253BRU100

Taps
64
Resistance (ohms)
100K
Number Of Circuits
4
Temperature Coefficient
650 ppm/°C Typical
Memory Type
Non-Volatile
Interface
I²C, 2-Wire Serial
Voltage - Supply
2.7 V ~ 5.5 V, ±2.25 V ~ 2.75 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
20-TSSOP
Resistance In Ohms
100K
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
AD5253/AD5254
ABSOLUTE MAXIMUM RATINGS
T
Table 4.
Parameter
V
V
V
V
Maximum Current
Digital Inputs and Output Voltage to GND
Operating Temperature Range
Maximum Junction Temperature (T
Storage Temperature Range
Lead Temperature (Soldering, 10 sec)
Vapor Phase (60 sec)
Infrared (15 sec)
TSSOP-20 Thermal Resistance
1
2
Maximum terminal current is bound by the maximum applied voltage across
any two of the A, B, and W terminals at a given resistance, the maximum
current handling of the switches, and the maximum power dissipation of the
package. V
Package power dissipation = (T
DD
SS
DD
A
A
, V
I
I
I
I
= 25°C, unless otherwise noted
WB
WB
WA
AB
to GND
to GND
to V
B
(R
, I
, V
Continuous
Continuous (R
Continuous (R
WA
AB
W
SS
to GND
Pulsed
= 1 kΩ/10 kΩ/50 kΩ/100 kΩ)
DD
= 5 V.
WB
WA
≤ 1 kΩ, A Open)
≤ 1 kΩ, B Open)
JMAX
2
− T
θ
JA
A
)/θ
JMAX
JA
.
1
1
1
)
Rating
−0.3 V, +7 V
+0.3 V, −7 V
7 V
V
±20 mA
±5 mA
±5 mA
±5 mA/±500 μA/
±100 μA/±50 μA
0 V, 7 V
−40°C to +85°C
150°C
−65°C to +150°C
300°C
215°C
220°C
143°C/W
SS
, V
DD
Rev. B | Page 8 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

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