AD7890AR-2 Analog Devices Inc, AD7890AR-2 Datasheet - Page 15

• Manufacturer Part Number: AD7890AR-2
• Description: A/D Converter (A-D) IC
• Manufacturer: Analog Devices Inc
• Type: Data Acquisition System (DAS)r

Specifications of AD7890AR-2

• No. Of Bits: 12 Bit
• No. Of Channels: 8
• Rohs Status: RoHS non-compliant
• Resolution (bits): 12 b
• Sampling Rate (per Second): 117k
• Data Interface: Serial
• Voltage Supply Source: Single Supply
• Voltage - Supply: 0 V ~ 2.5 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 24-SOIC (7.5mm Width)

DSCC FORM 2234
APR 97
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of
MIL-STD-883.
assured (see 3.5 herein).
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness
a.
b.
c.
a.
b.
c.
Test condition A, B, C, D, or E. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
End-point electrical parameters shall be as specified in table II herein.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All
device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
T
When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.
A
A
1/ PDA applies to subgroup 1.
2/ Subgroups 9, 10, 11 are tested initially and after any design changes which may affect the parameters in those
= +125 C, minimum.
= +25 C 5 C, after exposure, to the subgroups specified in table II herein.
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
subgroups.
requirements (see 4.4)
parameters (see 4.2)
parameters (see 4.2)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
Test requirements
Interim electrical
Final electrical
Group A test
STANDARD
TABLE II. Electrical test requirements.
method 5005, table I)
(in accordance with
MIL-STD-883,
1, 2, 3, 1/, 2/
Subgroups
1, 2, 3, 2/
9, 10, 11
9, 10, 11
class M
Device
1, 2, 3
1, 2, 3
1, 2, 3
- - -
SIZE
A
1, 2, 3, 1/, 2/
1, 2, 3, 2/
9, 10, 11
9, 10, 11
class Q
Device
1, 2, 3
1, 2, 3
1, 2, 3
- - -
MIL-PRF-38535, table III)
REVISION LEVEL
(in accordance with
Subgroups
C
1, 2, 3, 1/, 2/
1, 2, 3, 2/
9, 10, 11
9, 10, 11
class V
Device
1, 2, 3
1, 2, 3
1, 2, 3
- - -
SHEET
5962-95615
15