ADT7516ARQ Analog Devices Inc, ADT7516ARQ Datasheet - Page 17

• Manufacturer Part Number: ADT7516ARQ
• Description: DTS,12-Bit Quad DAC,4 Analog Inputs I.C.
• Manufacturer: Analog Devices Inc

Specifications of ADT7516ARQ

• Rohs Status: RoHS non-compliant
• Function: Temp Monitoring System (Sensor)
• Topology: ADC, Comparator, Multiplexer, Register Bank
• Sensor Type: External & Internal
• Sensing Temperature: -40°C ~ 120°C, External Sensor
• Output Type: I²C™, MICROWIRE™, QSPI™, SPI™
• Output Alarm: No
• Output Fan: No
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 120°C
• Mounting Type: Surface Mount
• Package / Case: 16-QSOP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• For Use With: EVAL-ADT7516EBZ - BOARD EVALUATION FOR ADT7516
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

TERMINOLOGY
Relative Accuracy
Relative accuracy or integral nonlinearity (INL) is a measure of
the maximum deviation, in LSBs, from a straight line passing
through the endpoints of the transfer function. Typical INL vs.
code plots are shown in Figure 8, Figure 9, and Figure 10.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±0.9 LSB maximum
ensures monotonicity. Typical DAC DNL vs. code plots can be
seen in Figure 11, Figure 12, and Figure 13.
Total Unadjusted Error (TUE)
Total unadjusted error is a comprehensive specification that
includes the sum of the relative accuracy error, gain error, and
offset error under a specified set of conditions.
Offset Error
Offset error is a measure of the offset error of the DAC and the
output amplifier (see Figure 40 and Figure 41). It can be
negative or positive, and it is expressed in mV.
Offset Error Match
Offset error match is the difference in offset error between any
two channels.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the actual DAC transfer characteristic from
the ideal expressed as a percentage of the full-scale range.
Gain Error Match
Gain error match is the difference in gain error between any
two channels.
Offset Error Drift
Offset error drift is a measure of the change in offset error
with changes in temperature. It is expressed in ppm of
full-scale range/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error
with changes in temperature. It is expressed in ppm of
full-scale range/°C.
Long-Term Temperature Drift
Long-term temperature drift is a measure of the change in
temperature error with the passage of time. It is expressed in °C.
The concept of long-term stability has been used for many years
to describe the amount an IC parameter shifts during its
lifetime. This is a concept that has typically been applied to both
voltage references and monolithic temperature sensors.
Rev. B | Page 17 of 44
Unfortunately, integrated circuits cannot be evaluated at room
temperature (25°C) for 10 years or so to determine this shift.
Manufacturers perform accelerated lifetime testing of integrated
circuits by operating ICs at elevated temperatures (between
125°C and 150°C) over a shorter period (typically between
500 hours and 1000 hours). As a result, the lifetime of an
integrated circuit is significantly accelerated due to the increase
in rates of reaction within the semiconductor material.
DC Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by
changes in the supply voltage. PSRR is the ratio of the change in
V
measured in dB. V
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC while
monitoring another DAC. It is expressed in μV.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated (that is, LDAC is high). It is expressed in dB.
Channel-to-Channel Isolation
Channel-to-channel isolation is the ratio of the amplitude of the
signal at the output of one DAC to a sine wave on the reference
input of another DAC. It is measured in dB.
Major Code Transition Glitch Energy
Major code transition glitch energy is the energy of the impulse
injected into the analog output when the code in the DAC
register changes state. It is normally specified as the area of the
glitch in nV-s and is measured when the digital code is changed
by 1 LSB at the major carry transition (011 . . . 11 to 100 . . . 00
or 100 . . . 00 to 011 . . . 11).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of a DAC from the digital input pins of the
device. However, it is measured when the DAC is not being
written to. It is specified in nV-s and is measured with a full-
scale change on the digital input pins, that is, from all 0s to all
1s or vice versa.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s and vice versa) in the input register of another
DAC. It is measured in standalone mode and is expressed in nV-s.
OUT
to a change in V
REF
ADT7516/ADT7517/ADT7519
DD
is held at 2 V and V
for full-scale output of the DAC. It is
DD
is varied ±10%.