ADUC7060BSTZ32 Analog Devices Inc, ADUC7060BSTZ32 Datasheet - Page 9

DUAL 24-BIT AFE AND ARM 7 I.C

ADUC7060BSTZ32

Manufacturer Part Number
ADUC7060BSTZ32
Description
DUAL 24-BIT AFE AND ARM 7 I.C
Manufacturer
Analog Devices Inc
Series
MicroConverter® ADuC7xxxr
Datasheets

Specifications of ADUC7060BSTZ32

Design Resources
4 mA-to-20 mA Loop-Powered Temperature Monitor Using ADuC7060/1 (CN0145) Low power, Long Range, ISM Wireless Measuring Node (CN0164)
Core Processor
ARM7
Core Size
16/32-Bit
Speed
10MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
POR, PWM, Temp Sensor, WDT
Number Of I /o
14
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
2.375 V ~ 2.625 V
Data Converters
A/D 5x24b, 8x24b, D/A 1x14b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
48-LQFP
Cpu Family
ADuC7xxx
Device Core
ARM7TDMI
Device Core Size
16/32Bit
Frequency (max)
10.24MHz
Interface Type
I2C/SPI/UART
Total Internal Ram Size
4KB
# I/os (max)
14
Number Of Timers - General Purpose
4
Operating Supply Voltage (typ)
2.5V
Operating Supply Voltage (max)
2.625V
Operating Supply Voltage (min)
2.375V
On-chip Adc
2(4-chx24-bit)
Instruction Set Architecture
RISC
Operating Temp Range
-40C to 125C
Operating Temperature Classification
Automotive
Mounting
Surface Mount
Pin Count
48
Package Type
LQFP
Package
48LQFP
Family Name
ADuC7xxx
Maximum Speed
10.24 MHz
Operating Supply Voltage
2.5 V
Data Bus Width
16|32 Bit
Number Of Programmable I/os
14
Number Of Timers
4
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Compliant

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Parameter
POWER REQUIREMENTS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
These numbers are not production tested but are guaranteed by design and/or characterization data at production release.
Valid for primary ADC gain setting of PGA = 4 to 64.
Tested at gain range = 4 after initial offset calibration.
Measured with an internal short. A system zero-scale calibration removes this error.
Measured with an internal short.
These numbers do not include internal reference temperature drift.
Factory calibrated at gain = 1.
System calibration at a specific gain range removes the error at this gain range.
Measured using an external reference.
Limited by the minimum absolute input voltage range.
Measured using the box method.
References up to AVDD are accommodated by setting ADC0CON Bit 12.
Reference DAC linearity is calculated using a reduced code range of 171 to 4095.
Reference DAC linearity is calculated using a reduced code range of 2731 to 65,535.
Die temperature.
Endurance is qualified to 10,000 cycles as per JEDEC Std. 22 Method A117 and measured at −40°C, +25°C, and +125°C. Typical endurance at 25°C is 170,000 cycles.
Retention lifetime equivalent at junction temperature (T
Typical additional supply current consumed during Flash/EE memory program and erase cycles is 7 mA and 5 mA, respectively.
Power Supply Voltages
Power Consumption
DVDD (±5%)
AVDD (±5%)
I
I
I
I
I
PWM
DD
DD
DD
DD
DD
(Auxiliary ADC)
(DAC)
(MCU Normal Mode)
(MCU Powered Down)
(Primary ADC)
18
1
Test Conditions/Comments
MCU clock rate = 10.24 MHz,
ADC0 on
MCU clock rate = 640 kHz,
ADC0 on, G = 4, ADC1/DAC off,
SPI on; POWCON2 = 0x4
Full temperature range
Reduced temperature range
−40°C to +85°C
Full temperature range
Reduced temperature range
−40°C to +85°C
PGA enabled, normal mode/low
power mode; current is
dependent on gain setting
ADC0 on, G = 1, normal mode
ADC0 on, G = 4, normal mode
ADC0 on, G = >128, normal mode
Normal mode/low power mode
DAC0CON = 0x10
J
) = 85°C as per JEDEC Std. 22 Method A117. Retention lifetime derates with junction temperature.
1
Rev. B | Page 9 of 108
Min
2.375
2.375
Typ
2.5
2.5
6
55
55
0.6/0.3
0.03
0.44
0.63
0.35/0.1
0.33
0.34
ADuC7060/ADuC7061
Max
2.625
2.625
10
3.1
2.74
350
120
Unit
V
V
mA
mA
mA
μA
μA
mA
mA
mA
mA
mA
mA
mA

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