04025A101FAT2A AVX Corporation, 04025A101FAT2A Datasheet - Page 12

• Manufacturer Part Number: 04025A101FAT2A
• Description: Cap Ceramic 100pF 50VDC C0G 1% SMD 0402 Paper T/R
• Manufacturer: AVX Corporation
• Type: Flatr
• Series: 0402r

Specifications of 04025A101FAT2A

• Package/case: 0402
• Mounting: Surface Mount
• Capacitance Value: 100 pF
• Dielectric: C0G
• Voltage: 50 Vdc
• Product Length: 1 mm
• Product Height: 0.56(Max) mm
• Product Depth: 0.5 mm
• Tolerance: 1 %
• Capacitance: 100pF
• Voltage - Rated: 50V
• Temperature Coefficient: C0G, NP0
• Mounting Type: Surface Mount, MLCC
• Operating Temperature: -55°C ~ 125°C
• Applications: General Purpose
• Package / Case: 0402 (1005 Metric)
• Size / Dimension: 0.039" L x 0.020" W (1.00mm x 0.50mm)
• Thickness: 0.56mm Max
• Dielectric Characteristic: C0G / NP0
• Capacitance Tolerance: ± 1%
• Voltage Rating: 50VDC
• Capacitor Case Style: 0402
• No. Of Pins: 2
• Capacitor Mounting: SMD
• Rohs Compliant: Yes
• Case Size: 0402
• Material, Element: Ceramic
• Termination: SMT
• Voltage, Rating: 50 VDC
• Operating Temperature Range: - 55 C to + 125 C
• Temperature Coefficient / Code: C0G (NP0)
• Product: General Type MLCCs
• Dimensions: 0.5 mm W x 1 mm L x 0.560 mm H
• Termination Style: SMD/SMT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Features: -
• Ratings: -
• Lead Spacing: -
• Lead Free Status / Rohs Status: RoHS Compliant part
• Other names: 478-3658-2

General Description
Effects of Time – Class 2 ceramic capacitors change
capacitance and dissipation factor with time as well as tem-
perature, voltage and frequency. This change with time is
known as aging. Aging is caused by a gradual re-alignment
of the crystalline structure of the ceramic and produces an
exponential loss in capacitance and decrease in dissipation
factor versus time. A typical curve of aging rate for semi-
stable ceramics is shown in Figure 6.
If a Class 2 ceramic capacitor that has been sitting on the
shelf for a period of time, is heated above its curie point,
(125°C for 4 hours or 150°C for
will de-age and return to its initial capacitance and dissi-
pation factor readings. Because the capacitance changes
rapidly, immediately after de-aging, the basic capacitance
measurements are normally referred to a time period some-
time after the de-aging process. Various manufacturers use
different time bases but the most popular one is one day
or twenty-four hours after “last heat.” Change in the aging
curve can be caused by the application of voltage and
other stresses. The possible changes in capacitance due to
de-aging by heating the unit explain why capacitance
changes are allowed after test, such as temperature cycling,
moisture resistance, etc., in MIL specs. The application of
high voltages such as dielectric withstanding voltages also
-2.5
-7.5
-10
2.5
-5
+10
+20
-10
-20
-30
0
0
-55 -35
Typical Cap. Change vs. Temperature
Typical Cap. Change vs. D.C. Volts
Temperature Degrees Centigrade
25%
-15
Percent Rated Volts
+5
Figure 4
Figure 5
X7R
X7R
+25 +45 +65 +85 +105 +125
50%
0VDC
1
⁄
2
hour will suffice) the part
75%
100%
tends to de-age capacitors and is why re-reading of capaci-
tance after 12 or 24 hours is allowed in military specifica-
tions after dielectric strength tests have been performed.
Effects of Frequency – Frequency affects capacitance
and impedance characteristics of capacitors. This effect is
much more pronounced in high dielectric constant ceramic
formulation than in low K formulations. AVX’s SpiCap soft-
ware generates impedance, ESR, series inductance, series
resonant frequency and capacitance all as functions of
frequency, temperature and DC bias for standard chip sizes
and styles. It is available free from AVX and can be down-
loaded for free from AVX website: www.avx.com.
+1.5
-3.0
-4.5
-1.5
-6.0
-7.5
0
1
Characteristic
C0G (NP0)
X7R, X5R
Y5V
Typical Curve of Aging Rate
10
100
Figure 6
Max. Aging Rate %/Decade
X7R
Hours
1000 10,000 100,000
None
2
7
67