PIC24HJ256GP610A-E/PT Microchip Technology, PIC24HJ256GP610A-E/PT Datasheet - Page 3

• Manufacturer Part Number: PIC24HJ256GP610A-E/PT
• Description: 16 Bit MCU 40MIPS 256KB FLASH 100 TQFP 12x12x1mm TRAY
• Manufacturer: Microchip Technology
• Series: PIC® 24Hr

Specifications of PIC24HJ256GP610A-E/PT

• Core Processor: PIC
• Core Size: 16-Bit
• Speed: 40 MIPs
• Connectivity: CAN, I²C, IrDA, LIN, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Number Of I /o: 85
• Program Memory Size: 256KB (85.5K x 24)
• Program Memory Type: FLASH
• Ram Size: 16K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Data Converters: A/D 32x10b/12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 100-TFQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Silicon Errata Issues
1. Module: ECAN
© 2010 Microchip Technology Inc.
Note:
The WAKIF bit in the CxINTF register cannot be
cleared by software instruction after the device is
interrupted from Sleep due to activity on the CAN
bus.
When the device wakes up from Sleep due to CAN
bus activity, the ECAN module is placed in
operational mode. The ECAN Event interrupt
occurs due to the WAKIF flag. Trying to clear the
flag in the Interrupt Service Routine (ISR) may not
clear the flag. The WAKIF bit being set will not
cause
execution.
Work around
Although the WAKIF bit does not clear, the device
Sleep and ECAN Wake functions continue to work
as expected. If the ECAN event is enabled, the
CPU will enter the Interrupt Service Routine due to
the WAKIF flag getting set. The application can
maintain a secondary flag, which tracks the device
Sleep and Wake events.
Affected Silicon Revisions
A2
X
This document summarizes all silicon
errata issues from all revisions of silicon,
previous as well as current. Only the
issues indicated by the shaded column in
the following tables apply to the current
silicon revision (A3).
A3
X
repetitive
Interrupt
PIC24HJ256GPX06A/X08A/X10A
Service
Routine
2. Module: ECAN
3. Module: UART
In user applications that perform both transmis-
sions and receptions using ECAN with DMA, inter-
mittent DMA Write Collisions might get generated,
resulting in the generation of DMA Error Traps.
The ECAN messages would be transmitted and
received correctly even when these DMA Error
Traps occur.
Work around
Within the DMA Error Trap service routine in the
application software, read the DMACS0 register
and inspect the two XWCOLn (n = 0, 1, …,7) bits
corresponding to the DMA channels being used for
ECAN transmission and reception.
For example, if DMA Channel 1 is used for ECAN
Reception and DMA Channel 2 is used for ECAN
Transmission, inspect the XWCOL1 and XWCOL2
bits. If either of these bits is found to be set, clear
the DMACERR bit in the INTCON1 register and
return from the DMA Error Trap service routine.
Affected Silicon Revisions
The UART module will not generate consecutive
break characters. Trying to perform a back-to-back
Break character transmission will cause the UART
module to transmit the dummy character used to
generate the first Break character instead of
transmitting the second Break character. Break
characters are generated correctly if they are
followed by non-Break character transmission.
Work around
None.
Affected Silicon Revisions
A2
A2
X
X
A3
A3
X
DS80482D-page 3