5962-8871309RA E2V, 5962-8871309RA Datasheet - Page 7

• Manufacturer Part Number: 5962-8871309RA
• Manufacturer: E2V

Specifications of 5962-8871309RA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C
d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
c. For quality conformance inspection, the programmability sample (see 4.3.1d) shall be included in subgroup 1 test.
changes which may affect capacitance. Sample size is fifteen devices with no failures and all input and output
terminals tested.
Group A, subgroups 9, 10, and 11.
DEFENSE SUPPLY CENTER COLUMBUS
(1)
(2)
(1)
(2)
(3)
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
A sample shall be selected to satisfy programmability requirements prior to performing subgroups 9, 10, and
11. Twelve devices shall be submitted to programming (see 3.2.2.1). If more than two devices fail to program,
the lot shall be rejected. At the manufacturers option, the sample may be increased to 24 total devices with no
more than four total device failures allowable.
Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9,
10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample
may be increased to 20 total devices with no more than 4 total device failures allowable.
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
TA = +125°C, minimum.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
IN
STANDARD
and C
OUT
measurement) shall be measured only for the initial test and after process or design
SIZE
A
REVISION LEVEL
A
SHEET
5962-88713
7