ADXRS453BEYZ-RL Analog Devices Inc, ADXRS453BEYZ-RL Datasheet - Page 9

• Manufacturer Part Number: ADXRS453BEYZ-RL
• Manufacturer: Analog Devices Inc

Specifications of ADXRS453BEYZ-RL

• Lead Free Status / RoHS Status: Compliant

Preliminary Technical Data
THEORY OF OPERATION
The ADXRS453 operates on the principle of a resonator gyro-
scope. Figure 18 shows a simplified version of one of four
polysilicon sensing structures. Each sensing structure contains a
dither frame that is electrostatically driven to resonance. This
produces the necessary velocity element to produce a Coriolis
force when experiencing angular rate. In the SOIC_CAV
package, the ADXRS453 is designed to sense a Z-axis (yaw)
angular rate; whereas the vertical mount package orients the
device such that it can sense pitch or roll angular rate on the
same PCB.
When the sensing structure is exposed to angular rate, the
resulting Coriolis force couples into an outer sense frame,
which contains movable fingers that are placed between fixed
pickoff fingers. This forms a capacitive pickoff structure that
senses Coriolis motion. The resulting signal is fed to a series of
gain and demodulation stages that produce the electrical rate
signal output. The quad sensor design rejects linear and angular
acceleration, including external g-forces and vibration. This is
achieved by mechanically coupling the four sensing structures
such that external g-forces appear as common-mode signals
that can be removed by the fully differential architecture
implemented in the ADXRS453.
The resonator requires 22.5 V (typical) for operation. Because
only 5 V is typically available in most applications, a switching
regulator is included on-chip.
Z
X
Y
Figure 18. Simplified Gyroscope Sensing Structure
Rev. PrA | Page 9 of 30
CONTINUOUS SELF-TEST
The ADXRS453 gyroscope utilizes a complete electro-
mechanical self test. An electrostatic force is applied to the
gyroscope frame, resulting in a deflection of the capacitive
sense fingers. This deflection is exactly equivalent to deflection
that occurs as a result of external rate input. The output from
the beam structure is processed by the same signal chain as a
true rate output signal, providing complete coverage of both the
electrical and mechanical components.
The electromechanical self test is performed continuously
during operation at a rate higher than the output bandwidth of
the device. The self-test routine generates equivalent positive
and negative rate deflections. This information can then be
filtered with no overall effect on the demodulated rate output.
The difference amplitude between the positive and negative
self-test deflections is filtered to 2 Hz, and continuously
monitored and compared to hardcoded self-test limits. If the
measured amplitude exceeds these limits (listed in Table 1), one
of two error conditions is asserted depending on the magnitude
of self-test error. For less severe self-test error magnitudes, the
CST bit of the fault register is asserted; however, the status bits
(ST[1:0]) in the sensor data response remain set to 0b01 for
valid sensor data. For more severe self-test errors, the CST bit of
the fault register is asserted and the status bits (ST[1:0]) in the
sensor data response are set to 0b00 for invalid sensor data. The
thresholds for both of these failure conditions are listed in Table
1. If desired, the user can access the self-test information by
issuing a read command to the self-test memory register
(Address 0x04). See the SPI Communication Protocol section
for more information about error reporting.
SELF TEST AMPLITUDE. INTERNALLY
COMPARED TO THE SPECIFICATION
TABLE LIMITS.
Figure 19. Continuous Self-Test Demodulation
CONTINUOUS SELF TEST SIGNAL.
RATE SIGNAL WITH
LOW FREQUENCY RATE INFORMATION.
ADXRS453