CY7C1412KV18-300BZXC Cypress Semiconductor Corp, CY7C1412KV18-300BZXC Datasheet - Page 24

• Manufacturer Part Number: CY7C1412KV18-300BZXC
• Description: CY7C1412KV18-300BZXC
• Manufacturer: Cypress Semiconductor Corp
• Series: -r

Specifications of CY7C1412KV18-300BZXC

• Format - Memory: RAM
• Memory Type: SRAM - Synchronous, QDR II
• Memory Size: 36M (2M x 18)
• Speed: 300MHz
• Interface: Parallel
• Voltage - Supply: 1.7 V ~ 1.9 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 165-LFBGA
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Capacitance
Tested initially and after any design or process change that may affect these parameters.
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
Document Number: 001-57825 Rev. *D
C
C
Note
Parameter
Parameter
25. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, Vref = 0.75 V, RQ = 250
IN
O
pulse levels of 0.25 V to 1.25 V, and output loading of the specified I


JA
JC
OUTPUT
DEVICE
UNDER
TEST
V
(a)
REF
ZQ
Input capacitance
Output capacitance
Thermal resistance
(junction to ambient)
Thermal resistance
(junction to case)
Z
RQ =
250 
0.75 V
0
= 50 
Description
Description
V
REF
R
L
= 0.75 V
= 50 
Figure 4. AC Test Loads and Waveforms
T
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
INCLUDING
A
DEVICE
UNDER
TEST
OUTPUT
= 25 C, f = 1 MHz, V
JIG AND
SCOPE
V
REF
ZQ
OL
/I
OH
and load capacitance shown in (a) of
0.75 V
RQ =
250 
Test Conditions
Test Conditions
V
(b)
REF
DD
= 0.75 V
R = 50 
= 1.8 V, V
5 pF
CY7C1410KV18, CY7C1425KV18
CY7C1412KV18, CY7C1414KV18
0.25 V
DDQ
= 1.5 V
AC Test Loads and
1.25 V
SLEW RATE= 2 V/ns
ALL INPUT PULSES
0.75 V
165 FBGA
Package
Max
13.7
3.73
4
4
Waveforms.

, V
Page 24 of 32
DDQ
[25]
°C/W
°C/W
Unit
Unit
= 1.5 V, input
pF
pF
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