MCP4725A0T-E/CH Microchip Technology, MCP4725A0T-E/CH Datasheet - Page 17

IC DAC 12BIT W/I2C SOT23A-6

MCP4725A0T-E/CH

Manufacturer Part Number
MCP4725A0T-E/CH
Description
IC DAC 12BIT W/I2C SOT23A-6
Manufacturer
Microchip Technology
Datasheets

Specifications of MCP4725A0T-E/CH

Number Of Converters
1
Package / Case
SOT-23-6
Settling Time
6µs
Number Of Bits
12
Data Interface
I²C, Serial
Voltage Supply Source
Single Supply
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Resolution
12 bit
Interface Type
Serial (2-Wire, I2C)
Supply Voltage (max)
5.5 V
Supply Voltage (min)
2.7 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
MCP4725DM-PTPLS - BOARD DAUGHTER PICTAIL MCP4725
Power Dissipation (max)
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
MCP4725A0T-E/CHTR
MCP4725AOT-E/CHTR
MCP4725AOT-E/CHTR

Available stocks

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Price
Part Number:
MCP4725A0T-E/CH
Manufacturer:
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Quantity:
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Part Number:
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Part Number:
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0
4.9
Offset error drift is the variation in offset error due to a
change in ambient temperature. The offset error drift is
typically expressed in ppm/
4.10
The Settling time is the time delay required for the DAC
output to settle to its new output value from the start of
code transition, within specified accuracy. In the
MCP4725, the settling time is a measure of the time
delay until the DAC output reaches its final value
(within 0.5 LSB) when the DAC code changes from
400h to C00h.
© 2009 Microchip Technology Inc.
Offset Error Drift
Settling Time
o
C.
4.11
Major-code transition glitch is the impulse energy
injected into the DAC analog output when the code in
the DAC register changes state. It is normally specified
as the area of the glitch in nV-Sec. and is measured
when the digital code is changed by 1 LSB at the major
carry transition (Example: 011...111 to 100... 000, or
100... 000 to 011 ... 111).
4.12
Digital feedthrough is the glitch that appears at the
analog output caused by coupling from the digital input
pins of the device. It is specified in nV-Sec. and is
measured with a full scale change on the digital input
pins (Example: 000... 000 to 111... 111, or 111... 111 to
000... 000). The digital feedthrough is measured when
the DAC is not being written to the register.
Major-Code Transition Glitch
Digital Feedthrough
MCP4725
DS22039D-page 17

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