08053E104ZAT2A AVX Corporation, 08053E104ZAT2A Datasheet - Page 21

CAPACITOR CERAMIC, 0.1UF, 25V, Z5U, 0805

08053E104ZAT2A

Manufacturer Part Number
08053E104ZAT2A
Description
CAPACITOR CERAMIC, 0.1UF, 25V, Z5U, 0805
Manufacturer
AVX Corporation
Datasheet

Specifications of 08053E104ZAT2A

Dielectric Characteristic
Z5U
Capacitance
0.1µF
Capacitance Tolerance
+80, -20%
Voltage Rating
25VDC
Capacitor Case Style
0805
No. Of Pins
2
Capacitor Mounting
SMD
Rohs Compliant
Yes
Y5V Dielectric
Specifications and Test Methods
20
Resistance to
Resistance to
Operating Temperature Range
Solder Heat
Load Life
Humidity
Stresses
Thermal
Flexure
Shock
Load
Insulation Resistance
Dielectric Strength
Dissipation Factor
Parameter/Test
Capacitance
Solderability
Capacitance
Capacitance
Capacitance
Capacitance
Capacitance
Appearance
Appearance
Appearance
Appearance
Appearance
Resistance
Resistance
Resistance
Resistance
Resistance
Dissipation
Dissipation
Dissipation
Dissipation
Dissipation
Insulation
Insulation
Insulation
Insulation
Insulation
Dielectric
Dielectric
Dielectric
Dielectric
Variation
Variation
Strength
Variation
Strength
Variation
Strength
Variation
Strength
Factor
Factor
Factor
Factor
Factor
No defects, <25% leaching of either end terminal
≥ 95% of each terminal should be covered
No breakdown or visual defects
≥ Initial Value x 0.1 (See Above)
≥ Initial Value x 0.1 (See Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
≤ Initial Value x 1.5 (See Above)
≤ Initial Value x 1.5 (See above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
≤ 12.5% for ≥ 10V DC rating
100,000MΩ or 500MΩ - µF,
≤ 5.0% for ≥ 50V DC rating
≤ 7.0% for ≥ 25V DC rating
≤ 9.0% for ≥ 16V DC rating
Y5V Specification Limits
Within specified tolerance
≥ Initial Value x 0.1
No visual defects
whichever is less
with fresh solder
No visual defects
-30ºC to +85ºC
No visual defects
No defects
≤ ±30%
≤ ±20%
≤ ±20%
≤ ±30%
≤ ±30%
1-5 seconds, w/charge and discharge current
Charge device with 300% of rated voltage for
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Dip device in eutectic solder at 260ºC for 60
Step 1: -30ºC ± 2º
Step 2: Room Temp
Step 3: +85ºC ± 2º
Step 4: Room Temp
Repeat for 5 cycles and measure after
24 ±2 hours at room temperature
Dip device in eutectic solder at 230 ± 5ºC
85% ± 5% relative humidity for 1000 hours
Store in a test chamber set at 85ºC ± 2ºC/
Charge device with twice rated voltage in
Remove from test chamber and stabilize
Remove from chamber and stabilize at
Charge device with rated voltage for
at room temperature for 24 ± 2 hours
For Cap > 10 µF, 0.5Vrms @ 120Hz
60 ± 5 secs @ room temp/humidity
(+48, -0) with rated voltage applied.
room temperature and humidity for
test chamber set at 85ºC ± 2ºC
24 ± 2 hours before measuring.
Temperature Cycle Chamber
Measuring Conditions
Voltage: 1.0Vrms ± .2V
for 1000 hours (+48, -0)
Test Time: 30 seconds
limited to 50 mA (max)
Freq.: 1.0 kHz ± 10%
for 5.0 ± 0.5 seconds
before measuring.
Deflection: 2mm
90 mm
1mm/sec
30 ± 3 minutes
≤ 3 minutes
≤ 3 minutes
30 ± 3 minutes

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