AD5666BRUZ-1 Analog Devices Inc, AD5666BRUZ-1 Datasheet - Page 10

• Manufacturer Part Number: AD5666BRUZ-1
• Description: IC DAC 16BIT QUAD 3V 14-TSSOP
• Manufacturer: Analog Devices Inc

Specifications of AD5666BRUZ-1

• Data Interface: DSP, MICROWIRE™, QSPI™, Serial, SPI™
• Settling Time: 6µs
• Number Of Bits: 16
• Number Of Converters: 4
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 105°C
• Mounting Type: Surface Mount
• Package / Case: 14-TSSOP
• Resolution (bits): 16bit
• Sampling Rate: 95kSPS
• Input Channel Type: Serial
• Supply Voltage Range - Analogue: 2.7V To 3.6V, 4.5V To 5.5V
• Supply Current: 1.3mA
• Digital Ic: RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Power Dissipation (max): -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5666
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
V
Digital Input Voltage to GND
V
V
Operating Temperature Range
Storage Temperature Range
Junction Temperature (T
TSSOP Package
Reflow Soldering Peak Temperature
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
DD
OUT
REFIN
A
Industrial
Power Dissipation
θ
SnPb
Pb Free
= 25°C, unless otherwise noted.
to GND
JA
to GND
/V
Thermal Impedance
REFOUT
to GND
J MAX
)
Rating
−0.3 V to +7 V
−0.3 V to V
−0.3 V to V
−0.3 V to V
−40°C to +105°C
−65°C to +150°C
+150°C
(T
150.4°C/W
240°C
260°C
J MAX
− T
A
)/θ
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
JA
Rev. D | Page 10 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.